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Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry

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Abstract

Diffusion of oxide ions along heterostructured yttria-stabilized zirconia (YSZ) epitaxially grown on single crystalline MgO (001) is investigated. Pulsed laser deposition is used for the epitaxial growth and focused ion beam was applied to open the lateral surface of the YSZ-MgO interface layers and to enable incorporation and diffusion of oxygen. The sample is annealed in 18O2 environment to trace oxide ion transport with Al2O3 layers atop to block diffusion perpendicular to surface of the YSZ plane. Time-of-flight secondary mass ion spectrometry (TOF–SIMS) analyze the planar diffusion profiles. Diffusivity and surface exchange rate are estimated by SIMS data fitting. As a result, it is identified that both oxide ion diffusion and surface incorporation rates are significantly enhanced on surface of the heterostructured YSZ on MgO (001) compared to bulk YSZ.

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Abbreviations

YSZ:

Yttria-stabilized zirconia

STO:

Strontium titanate

PLD:

Pulsed laser deposition

FIB:

Focused ion beam

SEM:

Scanning electron microscopy

TOF–SIMS:

Time-of-flight secondary ion mass spectrometry

XRD:

X-ray diffraction

k :

Surface exchange coefficient (cm/s)

D :

Oxide ion self-diffusion coefficient (cm2/s)

c gas :

Relative concentration of 18O in the environment gas during the ion diffusion

c surface :

Relative concentration of 18O at the surface

c :

Realtive concentration of 18O in YSZ

h :

k/D

c hg :

Relative natural background concentration of 18O

ALD:

Atomic layer deposition

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Acknowledgements

This research was supported by the Hydrogen Energy Innovation Technology Development Program of the National Research Foundation (NRF) of Korea funded by the Korean Ministry of Science and ICT (MSIT) (No. NRF-2019M3E6A1064697). This work was also supported by the Korea Electric Power Corporation (Grant Number: R17XA05-57), the Agency for Defense Development (UD170107GD), Republic of Korea and Korea University Internal Grant.

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Authors and Affiliations

  1. School of Mechanical Engineering, Korea University, Anam-ro 145, Seongbuk-gu, Seoul, 02841, South Korea

    Kiho Bae, Dong Young Jang & Joon Hyung Shim

  2. Department of Mechanical Engineering, Stanford University, Stanford, CA, 94305, USA

    Kiho Bae, Joong Sun Park & Fritz B. Prinz

  3. Center for Energy Materials Research, Korea Institute of Science and Technology (KIST), 5 Hwarang-ro 14-gil, Seongbuk-gu, Seoul, 02792, South Korea

    Ji-Won Son

  4. KU-KIST Graduate School of Energy and Environment (Green School), Seoul, 02841, South Korea

    Ji-Won Son

  5. Department of Materials Science and Engineering, Stanford University, Stanford, CA, 94305, USA

    Fritz B. Prinz

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  1. Kiho Bae
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Bae, K., Jang, D.Y., Park, J.S. et al. Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry. Int. J. of Precis. Eng. and Manuf.-Green Tech. 7, 405–410 (2020). https://doi.org/10.1007/s40684-019-00169-3

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