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Automatic Determination of the Weak-Beam Condition in Dark Field X-ray Microscopy

  • Thematic Section: 3D Materials Science 2022
  • Published:
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Abstract

Mechanical properties in crystals are determined by the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within crystals using multidimensional scans. However, the methods required to reconstruct meaningful dislocation information from high-dimensional DFXM scans are still nascent and require significant manual oversight (i.e., supervision). In this work, we present a new relatively unsupervised method that extracts dislocation-specific information (features) from a 3D dataset (x, y, \(\phi \)) using Gram–Schmidt orthogonalization to represent the large dataset as an array of 3-component feature vectors for each position, corresponding to the weak-beam conditions and the strong-beam condition. This method offers key opportunities to significantly reduce dataset size while preserving only the crystallographic information that is important for data reconstruction.

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Acknowledgments

We acknowledge the European Synchrotron Radiation Facility (ESRF) for provision of synchrotron radiation facilities and we would like to thank Can Yildirim for conducting the experiments at beamline ID06-HXM.

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Authors and Affiliations

  1. Department of Materials Science and Engineering, Stanford University, 476 Lomita Mall, Stanford, CA, 94305, USA

    Pin-Hua Huang & Leora Dresselhaus-Marais

  2. SLAC National Accelerator Laboratory, 2575 Sand Hill Rd., Menlo Park, CA, 94025, USA

    Ryan Coffee & Leora Dresselhaus-Marais

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  1. Pin-Hua Huang
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  2. Ryan Coffee
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Correspondence to Leora Dresselhaus-Marais.

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Huang, PH., Coffee, R. & Dresselhaus-Marais, L. Automatic Determination of the Weak-Beam Condition in Dark Field X-ray Microscopy. Integr Mater Manuf Innov 12, 83–91 (2023). https://doi.org/10.1007/s40192-023-00295-6

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  • DOI: https://doi.org/10.1007/s40192-023-00295-6

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