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Nanoscale mechanical probing of ferroic materials

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Abstract

Mechanical probing, that is using the mechanical force of an atomic force microscopy (AFM) tip for materials’ characterization, has provided a plethora of research opportunities in ferroic materials over the past years. Unique mechanical force-based AFM modes with compatible techniques allow for the study of rather scarcely explored nanoscale phenomena and functionalities in ferroic materials. The key aspect of this involves force interactions, as a main stimulus to enable exploration of mechanically induced novel functionalities closely associated with elastic properties. Mechanical force imposed by an AFM tip at the nanoscale also offers a unique pathway to dynamically control structural phase transitions and ferroic states such as an electric polarization, magnetization, and strain with their associated functionalities from charge dynamics to electrical conduction. Here, we provide a comprehensive overview of nanoscale mechanical probing in ferroic materials with the recent trends and give an outlook on future research opportunities for technological applications.

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Acknowledgements

This work was supported by the INHA UNIVERSITY Research Grant.

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  1. Department of Physics, Inha University, Incheon, 22212, Republic of Korea

    Yooun Heo

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  1. Yooun Heo
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Correspondence to Yooun Heo.

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Heo, Y. Nanoscale mechanical probing of ferroic materials. J. Korean Phys. Soc. 84, 661–671 (2024). https://doi.org/10.1007/s40042-024-01034-6

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  • DOI: https://doi.org/10.1007/s40042-024-01034-6

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