Abstract
We present a method, based on transmission or reflection optical microscopy, to determine the number of graphene monolayers deposited on various substrates. To demonstrate the procedure, we synthesize graphene samples and deposit them on various substrates with the micromechanical cleavage technique. Our procedure initially relies on more classical approaches such as atomic force microscopy (AFM) and Raman to calibrate the equipment. After calibration, however, optical microscopy by itself is sufficient to characterize other samples, deposited on any substrate.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, S.V. Dubonos, I.V. Grigorieva, and A.A. Firsov, Science,306, 666, 2004
L. Changgu, W. Xiaoding, W. Jeffrey and James Hone, Science 321, 385, 2008
R. R. Nair, P. Blake, A. N. Grigorenko, K. S. Novoselov, T. J. Booth, T. Stauber, N. M. R. Peres, and A. K. Geim, Science,320, 1308, 2008
A. K. Geim, Science,324, 1530, 2009
A. K. Geim and P. Kim, Scientific American, 90–97, 2008
C. Orofeo, H. Ago, B.S. Hu and M. Tsuji, Nano Research, 4, 531, 2011
E. Moreau, S. Godey, D. Vignaud, X. Wallart, J. Avila, M.C. Asencio, F. Bournel, and J.J. Gallet, Applied Physics Letters, 97, 241907, 2010
E. Moreau, F.J. Ferrer, D.Vignaud, S. Godey, and X. Wallart, Physica Status Solidi A-Aplications and Materials Science, 207, 300, 2010
A. C. Ferrari, Solid State Communications 143, 47, 2011
R.R. Nair, P. Blake, A. N. Grigorenko, K.S. Novoselov, T. J. Booth, T. Stauber, N.M.R. Peres and A.K. Geim, Science, 320, 1308, 2008
P. Blake, E.W. Hill, A.H. Castro Neto, K.S. Novoselov, D. Jiang, R. Yang, T.J. Booth and A.K. Geim, Applied Physics Letters, 91, 063124, 2007
R. Verma, B.D. Gupta and R. Jhan, Sensors and Actuators B, 160, 623, 2011
Acknowledgments
The authors are in debt with the Nacional de Grafite, MG, Brazil, by the graphite Natural used in this work and the CEM of UFABC. A special consideration to Prof. Dr. Pablo Fiorito for the aid with AFM and to Prof. Mariselma Ferreira for the facilities to use the optical microscopes, which provided substantial help in the development of this work.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Obelenis, F., Champi, A. Determination of the Number of Graphene Layers on Different Substrates by Optical Microscopy Technique. Braz J Phys 44, 682–686 (2014). https://doi.org/10.1007/s13538-014-0260-4
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s13538-014-0260-4