Abstract
Non-crystalline thin films of Ge20Te80−xSbx (x = 0, 2, 4, 6, 10) systems were deposited on glass substrate using thermal evaporation technique. The optical coefficients were accurately determined by transmission spectra using Swanepoel envelope method in the spectral region of 400–1600 nm. The refractive index was found to increase from 2.38 to 2.62 with the corresponding increase in Sb content over the entire spectral range. The dispersion of refractive index was discussed in terms of the single oscillator Wemple–DiDomenico model. Tauc relation for the allowed indirect transition showed decrease in optical band gap. To explore non-linearity, the spectral dependence of third order susceptibility of a-Ge–Te–Sb thin films was evaluated from change of index of refraction using Miller’s rule. Susceptibility values were found to enhance rapidly from 10−13 to 10−12 (esu), with the red shift in the absorption edge. Non-linear refractive index was calculated by Fourier and Snitzer formula. The values were of the order of 10−12 esu. At telecommunication wavelength, these non-linear refractive index values showed three orders higher than that of silica glass. Dielectric constant and optical conductivity were also reported. The prepared Sb doped thin films on glass substrate with observed improved functional properties have a noble prospect in the application of nonlinear optical devices and might be used for a high speed communication fiber. Non-linear parameters showed good agreement with the values given in the literature.
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Kumar, P., Kaur, J., Tripathi, S.K. et al. Effect of antimony (Sb) addition on the linear and non-linear optical properties of amorphous Ge–Te–Sb thin films. Indian J Phys 91, 1503–1511 (2017). https://doi.org/10.1007/s12648-017-1053-8
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DOI: https://doi.org/10.1007/s12648-017-1053-8