Abstract
The printability of patterns for printed electronic devices determines the performance, yield rate, and reliability of the devices; therefore, it should be assessed quantitatively. In this paper, parameters for printability assessment of printed patterns for width, pinholes, and edge waviness are suggested. For quantitative printability assessment, printability grades for each parameter are proposed according to the parameter values. As examples of printability assessment, printed line patterns and mesh patterns obtained using roll-to-roll gravure printing are used. Both single-line patterns and mesh patterns show different levels of printability, even in samples obtained using the same printing equipment and conditions. Therefore, for reliable assessment, it is necessary to assess the printability of the patterns by enlarging the sampling area and increasing the number of samples. We can predict the performance of printed electronic devices by assessing the printability of the patterns that constitute them.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
H. A. D. Nguyen, J. S. Lee, C. H. Kim, K. H. Shin and D. J. Lee, An approach for controlling printed line-width in high resolution roll-to-roll gravure printing, J. Micromech. Microeng, 23 (2013) 095010.
C. H. Kim, J. D. Jo and S. H. Lee, Design of roll-to-roll printing equipment with multiple printing methods for multilayer printing, Review of Scientific Instruments, 83 (2012) 065001.
J. H. Park, H. A. D. Nguyen, S. S. Park, J. S. Lee, B. S. Kim and D. J. Lee, Roll-to-roll gravure printed silver patterns to guarantee printability and functionality for mass production, Current Applied Physics, 15 (2015) 367–376.
S. W. Jeon, C. Kim, J. C. Park, D. S. Kim and C. H. Kim, Measurement of geometric properties of printed patterns and evaluation of their printability, J. Korean Soc. Precis. Eng., 31 (2014) 981–986.
C. H. Kim, Y. S. Lee, Y. G. Kim and D. S. Kim, Effect of printing qualities on the resonant frequencies of printed UHF RFID tag antennas, J. Korean Soc. Precis. Eng., 25 (2008) 90–94.
S. H. Kim and H. J. Sung, Effect of printing parameters on gravure patterning with conductive silver ink, J. Micromech. Microeng., 25 (2015) 045004.
J. H. Choi, C. W. Lee and K. H. Shin, A study on the relation between strain & conductivity of the printed pattern in post-printing section of roll to roll process, J. Institute of Control Robotics and Systems, 15 (2009) 877–880.
H. A. D. Nguyen, C. W. Lee and K. H. Shin, A mathematical model to predict surface roughness and pattern thickness in roll-to-roll gravure printed electronics, Robotics and Computer-Integrated Manufacturing., 29 (2012) 26–32.
IEC 62899-402-1 Ed. 1.0 (In press).
J. S. Kim and D. S. Kim, Fabrication method of metal grid mesh film using the gravure offset printing, J. Korean Soc. Precis. Eng., 31 (2104) 969–974.
J. S. Yu, J. D. Jo, S. M. Yoon and D. J. Kim, Study and fabrication of transparent electrode film by using thermalroll imprinted Ag mesh pattern and coated conductive polymer, J. Korean Soc. Precis. Eng., 27 (2010) 11–15.
B. O. Choi, J. D. Jo, D. S. Kim, K. J. Lim and B. S. Ryu, True rolling technique of new gravure-offset printing for R2R over-piling, J. Korean Soc. Precis. Eng., 28 (2011) 1131–1140.
J. S. Lee, H. A. D. Nguyen, C. H. Kim, K. H. Shin and D. J. Lee, An effect of mechanical factors on printability of micropattern in roll-to-roll printing process, Proc. Conf. Korean. Soc. Precis. Eng. (2102) 259–260.
R. C. Gonzalez, R. E. Woods and S. L. Eddins, Digital Image Processing Using MATLAB, 2th Ed., Prentice Hall (2012) 481–500.
Author information
Authors and Affiliations
Corresponding author
Additional information
Recommended by Associate Editor Jaewon Chung
Sung Woong Jeon received M.S. in Mechanical Engineering from Chungnam National University in 2016 under advisor Prof. Chung Hwan Kim. He had experienced in the research fields of design and control of printing machine, measurement of printing process, and assessment of printability in printed electronics. He is currently a Researcher in Daegu Gyeongbuk Institute of Science and Technology, Daegu, Korea.
Cheol Kim received B.S. in Mechanical & Metallurgical Engineering from Chungnam National University in 2016, and is now in the master’s course in Mechanical Engineering from Chungnam National University under advisor Prof. Chung Hwan Kim. His main interests are design and control of printing machine and assessment of reliability of flexible electronic devices under mechanical loads.
Chung Hwan Kim received Ph.D. in Mechanical Engineering from KAIST, Korea in 2003. He worked for Samsung Electronics and Korea Institute of Machinery and Materials. Since 2010, he has been working at Chungnam National University. Meanwhile he is working as the Convener of Working Group (Printability) of international standardization for Printed Electronics, IEC TC119. His main research interests are design and control of the printing machines, the measurement of the parameters in printing process, and the improvement of printability in the printing process for printed electronics.
Rights and permissions
About this article
Cite this article
Jeon, S.W., Kim, C. & Kim, C.H. Assessment of printability for printed electronics patterns by measuring geometric dimensions and defining assessment parameters. J Mech Sci Technol 30, 5625–5631 (2016). https://doi.org/10.1007/s12206-016-1131-4
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s12206-016-1131-4