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Bias-dependent photo-detection of dual-ion beam sputtered MgZnO thin films

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Abstract

The structural, morphological, elemental and electrical properties of MgZnO thin films, grown on p-Si (001) substrates by dual-ion beam sputtering deposition (DIBSD) system at different substrate temperatures were thoroughly investigated. X-ray diffraction (XRD) pattern of MgZnO film exhibited crystalline hexagonal wurtzite structure with the preferred (002) crystal orientation. The full-width at half-maximum of the (002) plane was the narrowest with a value of 0.226° from MgZnO film grown at 400°C. X-ray photoelectron spectroscopy analysis confirmed the substitution of Zn2+ by Mg2+ in MgZnO thin films and the absence of MgO phase. Correlation between calculated crystallite size, as evaluated from XRD measurements, and room-temperature carrier mobility, as obtained from Hall measurements, was established. Current–voltage characteristics of MgZnO thin films were carried out under the influence of dark and light illumination conditions and corresponding values of photosensitivity were calculated. MgZnO film grown at 100°C exhibited the highest photosensitivity of 1.62. Compared with one of the best-reported values of photosensitivity factor from ZnO-material-based films available in the literature, briefly, ∼3.085-fold improved photosensitivity factor at the same bias voltage (2 V) was obtained.

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Acknowledgements

This work was partially supported by Department of Science and Technology (DST) Fast Track Scheme for Young Scientist No. SR/FTP/ETA-101/2010. This work was also supported by DST Science and Engineering Research Board (SERB) project number SR/S3/EECE/0142/2011 and Council of Scientific and Industrial Research (CSIR) project number 22(0608)/12/EMR-II. We are also grateful for the Atomic Force Microscopy (AFM) Facility equipped at Sophisticated Instrument Centre (SIC), IIT Indore. We also express gratitude to Dr Mukul Gupta, UGC-DAE CSR, Indore, for XRD measurement of samples.

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  1. Discipline of Electrical Engineering, Indian Institute of Technology, Indore, 452003, India

    SAURABH KUMAR PANDEY & SHAIBAL MUKHERJEE

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  1. SAURABH KUMAR PANDEY
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  2. SHAIBAL MUKHERJEE
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Correspondence to SAURABH KUMAR PANDEY.

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PANDEY, S.K., MUKHERJEE, S. Bias-dependent photo-detection of dual-ion beam sputtered MgZnO thin films. Bull Mater Sci 39, 307–313 (2016). https://doi.org/10.1007/s12034-015-1131-5

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