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An in-process tool wear assessment using Bayesian optimized machine learning algorithm

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Abstract

Cutting tool wear monitoring (TWM) plays a significant role because it guarantees the machined surface integrity. Therefore, the present article proposed a TWM system using Bayesian optimized-support vector regression (BO-SVR) analysis. This objective was realized by acquiring machined surface texture video during machining from an in-situ CMOS camera, and subsequently, analyzing it by feature extraction, selection, predictive model training, model hyperparameters optimization, and model testing and validation. To develop an in-process TWM system, machined surface video is acquired during the machining process, and analyzed using Gabor wavelet (GW) and grey level co-occurrence matrix (GLCM) to extract the information related to roughness, feed marks, and waviness of texture. The significant features are selected using the fisher discriminant ratio (FDR) analysis. The in-process TWM system is trained using the FDR selected features and the predictive model hyperparameters such as C, gamma, epsilon, and kernel type are optimized using the Bayesian optimization algorithm, and their optimized results are 99.51, 0.55, 0.01186, and RBF. An optimized hyperparameters are used to establish an accurate and reliable in-process TWM system. The prediction model accuracy is compared with experimentally measured tool wear, the proposed BO-SVR model can predict tool wear with an RMSE of 0.026494.

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Data availability

The authors confirm that the data supporting the findings of this study are available within the article [and/or] its supplementary materials.

Code availability

Code will made available from the corresponding author on reasonable request.

Abbreviations

CMOS:

Complementary metal–oxide semiconductor

FDR:

Fisher discriminant ratio

SVR:

Support vector regression

RMSE:

Root mean square error

TWM:

Tool wear monitoring

BO:

Bayesian optimization

GLCM:

Grey level co-occurrence matrix

MLPNN:

Multilayer perceptron neural network

WNN:

Wavelet neural network

HMM:

Hidden Markov model

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The current research was not supported by any funding.

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MSB: Conceptualization, Methodology, Formal analysis, Data curation, original draft preparation, and editing. TBR: Supervision.

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Correspondence to Mulpur Sarat Babu.

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Babu, M.S., Rao, T.B. An in-process tool wear assessment using Bayesian optimized machine learning algorithm. Int J Interact Des Manuf 17, 1823–1845 (2023). https://doi.org/10.1007/s12008-023-01270-3

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