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A design approach of bonding head guiding platform for die to wafer hybrid bonding application using compliant mechanism

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Abstract

In semiconductor manufacturing process, the wafer direct bonding, so-called die-to-wafer hybrid bonding, still has unexpected voids on the boning surface which decreases the bonding efficiency. Therefore, this paper proposes a design approach for the bonding head guiding platform (BHGP) based on compliant mechanism for the die-to-wafer hybrid bonding. Firstly, a bridge amplification module (BAM) is designed and simulated. Secondly, a dual parallelogram module (DPM) is designed and analyzed. Then, the BAM is combined with the DPM to create a full design of the BHGP. To investigate the parametric effect of the geometric inputs on the output behaviors of the platform, the parameter sensitivity is conducted. The multi-objective optimization study is performed using multi-objective genetic algorithm. The results determined the displacement can gain up to 191.88 μm, the parasitic error has a small value of 1.47 μm, and the von Mises stress is minimal value of 52 MPa. The crosstalk of the platform is about 3.82%, and this ratio ensures a linear characteristic of the platform. A small value of stress allows a high safety factor during operation. The result of this study is expected be utilized for removing voids in the die-to-wafer hybrid bonding process.

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Acknowledgements

This research is supported by Industrial University of Ho Chi Minh City (IUH) under grant number 01/HD-DHCN.

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Correspondence to Thanh-Phong Dao.

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Nguyen, D.N., Dang, M.P., Dixit, S. et al. A design approach of bonding head guiding platform for die to wafer hybrid bonding application using compliant mechanism. Int J Interact Des Manuf 17, 2855–2866 (2023). https://doi.org/10.1007/s12008-022-01019-4

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