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An accurate pose measurement method of workpiece based on rapid extraction of local feature points

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Abstract

Ceramic sanitary products with complex curved surfaces are generally fragile and difficult to clamp. If the industrial robot is utilized to realize the automatic grinding of such products, the precise positioning of the product is required firstly. In this paper, an accurate pose measurement system for complex curved surface parts is designed by point cloud registration algorithm. In order to improve the stability of the system, this paper combines the advantages of normal vector features and fast point feature histogram (FPFH) features, and proposes a point cloud registration algorithm based on the rapid extraction of local feature points. Experimental results verify that the improved algorithm has improved both efficiency and accuracy, and the system can effectively achieve accurate positioning of products.

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Authors and Affiliations

  1. Tianjin Key Laboratory for Advanced Mechatronic System Design and Intelligent Control, School of Mechanical Engineering, Tianjin University of Technology, Tianjin, 300384, China

    Jiangtao Zhang, Zhifeng Qiao & Shihao Wang

  2. National Demonstration Center for Experimental Mechanical and Electrical Engineering Education, Tianjin University of Technology, Tianjin, 300384, China

    Jiangtao Zhang, Zhifeng Qiao & Shihao Wang

Authors
  1. Jiangtao Zhang
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  2. Zhifeng Qiao
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  3. Shihao Wang
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Corresponding author

Correspondence to Zhifeng Qiao.

Additional information

This work has been supported by the Tianjin Key Research and Development Project (No.19YFSLQY00050), the Tianjin Science and Technology Major Project and Engineering Project (No.19ZXZNGX00100), and the Tianjin Enterprise Science and Technology Commissioner Project (No.20YDTPJC00790).

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The authors declare that there are no conflicts of interest related to this article.

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Zhang, J., Qiao, Z. & Wang, S. An accurate pose measurement method of workpiece based on rapid extraction of local feature points. Optoelectron. Lett. 18, 372–377 (2022). https://doi.org/10.1007/s11801-022-1152-4

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  • DOI: https://doi.org/10.1007/s11801-022-1152-4

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