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A New Residual Strain Mapping Program Using Energy Dispersive X-Ray Diffraction at the Advanced Photon Source

  • Sp Iss: Advances in Residual Stress Technology
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Abstract

Background

The ability to non-destructively map the residual strain field inside an engineering component is important for predicting its fatigue life or developing processing methods to prevent failure or enhance performance.

Objective

In this paper, we describe a new residual strain mapping program at the Advanced Photon Source, Argonne National Laboratory.

Methods

The new program is based on energy dispersive x-ray diffraction (EDXRD). It is capable of non-destructively penetrating a several-cm thick polycrystalline sample fabricated from engineering alloys using high-energy x-rays and measuring the residual strain field with mm or better spatial resolution and approximately \(\pm 1 \times 10^{-4}\) strain resolution. A multi-element detector array is employed to measure multiple strain components simultaneously. The residual strain mapping setup is augmented with a high-energy tomography capability, allowing precise alignment of the material volume of interest for residual strain mapping and providing a complementary view of the structure to understand the measured strain field.

Results

These measurement capabilities are demonstrated using several strain mapping examples ranging from polycrystalline structural alloys to biological materials. We also provide some guidance for the future users of the program for a successful residual strain mapping experiment.

Conclusions

We are expanding the capabilities of the new setup with various in situ capabilities including thermo-mechanical loading.

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Notes

  1. More detailed information is available in Appendix

  2. More detailed information is available in Appendix

  3. For larger samples, \({X}_{L}\) and \({Z}_{L}\) translations can also be used for strain mapping.

  4. Pseudo-strain is the deviation of plane spacing from its reference value normalized by the reference value.

  5. This is similar to the partial volume illumination induced pseudo-strains reported by researchers using neutrons [31, 32], laboratory x-rays [33], and ADXRD with diffracted beam apertures [34].

  6. This is a calibrated energy based on an absorption edge of Rhenium.

  7. Only the radial component of strain measured in Region-I is shown for brevity. The maps for other strain components and Region-II also follow the anticipated residual strain field imparted by the sample geometry.

  8. Matlab smoothdata with Gaussian filter was employed on the raw strain field data to reduce the noise and highlight the trends better.

  9. Here, we only show the two detectors nominally placed orthogonal to each other for brevity.

  10. For the experimental data presented in Fig. 15, analysis is ongoing and the full result will be presented in the near future through a separate publication.

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Acknowledgements

This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility at Argonne National Laboratory and is based on research supported by the U.S. DOE Office of Science-Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. The authors acknowledge Ali Mashayekhi and Roger Ranay of the APS for their assistance in setting up the EDXRD program at the APS 6-BM beamline. Beamline 6BM-B, APS, is supported by COMPRES, the Consortium for Materials Properties Research in Earth Sciences under NSF Cooperative Agreement EAR-1661511. JSP acknowledges discussions with Basil Blank of PulseRay Inc., NY for the development of the interference fit sample.

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Authors and Affiliations

  1. X-ray Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, 60439, IL, USA

    J.-S. Park, A.C. Chuang, J. Okasinski & J. Almer

  2. Mineral Physics Institute, State University of New York at Stony Brook, Earth and Space Science Building, Stony Brook, 11794, NY, USA

    H. Chen

  3. Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright‑Patterson AFB, Dayton, 45433, OH, USA

    P. Shade & T.J. Turner

  4. Department of Cell and Developmental Biology, Feinberg School of Medicine, Northwestern University, 303 East Chicago Avenue, Chicago, 60611, IL, USA

    S. Stock

  5. Simpson Querrey Institute, Northwestern University, 303 East Superior Street, Chicago, 60611, IL, USA

    S. Stock

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Appendix

Appendix

Supplementary Information for 6-BM-A and 6-BM-B

In Fig. 2, Slit-0 is the white beam mask. Slit-1 and Slit-2 define the incident beam size in the \({X}_{L}-{Y}_{L}\) plane. Slit-3 and Slit-4 define the vertical aperture for the detector placed in the \({Y}_{L}-{Z}_{L}\) plane (vertical detector) and collimate the diffracted beam emanating from the GV at \({O}_{L}\). Similarly, Slit-5 and Slit-6 define horizontal aperture for the detector placed in the \({X}_{L}-{Z}_{L}\) plane (horizontal detector). Table 1 summarizes the approximate distances of these setup components. Table 2 summarizes the approximate distances of the major components in the 6-BM-B hutch.

Table 1 Approximate distances of the major 6-BM-A setup components with respect to the BM source
Full size table
Table 2 Approximate distances of the major 6-BM-B setup components with respect to the BM source
Full size table

Table 3 shows the specifications of the 6-BM-A radiography system. It is an APS in-house developed detector using high-energy x-ray scintillator and a CMOS detector. The maximum beam size at 6-BM available for radiography or tomography is 4.4 mm (H) x 1.5 mm (V).

Table 3 The field-of-view (FOV) and pixel resolution of the radiography detector under various detector optics configurations
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Park, JS., Chuang, A., Okasinski, J. et al. A New Residual Strain Mapping Program Using Energy Dispersive X-Ray Diffraction at the Advanced Photon Source. Exp Mech 62, 1363–1379 (2022). https://doi.org/10.1007/s11340-022-00859-1

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