Skip to main content
SpringerLink
Log in

Application of X-Ray Diffraction Methods for Refractory Raw Material Quality Control

  • Published:
Refractories and Industrial Ceramics Aims and scope

The majority of refractory materials and raw minerals used for their production are crystalline substances. X-ray diffraction techniques can be used successfully for qualitative and quantitative determination of their mineral composition and for analysis of the technologically significant structural features that are most important in a production process. Examples are considered for the main types of refractory materials and are studied with the full-profile Rietveld refinement method in order to reveal control parameters during their production. It is concluded that structural properties of mineral phases should be taken into account that have a considerable effect on refractory material mechanical properties.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.
Fig. 5.
Fig. 6.
Fig. 7.
Fig. 8.
Fig. 9.

Similar content being viewed by others

References

  1. I. D Kashcheev, K. K. Strelov, and P. S. Mamyshkin, Refractory chemical technology [in Russian], Intermet Inzhiniring, Moscow (2007).

  2. R. A. Young, The Rietveld Method, Oxford University Press, UK (1995).

    Google Scholar 

  3. D. Frulli, “Production and characteristics of refractory raw materials based ion andalusite and mullite. Effect of impurities on refractory properties,” Syr. Materialy, No. 3, 93 – 97 (2017).

  4. P. G. Usov and V. I. Vereshchagin, “Polymorphism of magnesium metasilicate in steatite objects at high temperature,” Izv. TPI, No. 196, 106 – 109 (1968).

  5. p. G. Usov, “Effect of calcite impurities on steatite ceramic properties,” Izv. TPI, No. 234, 57 – 60 (1974).

Download references

Author information

Authors and Affiliations

  1. AO Scientific Center Burevestnik, St. Petersburg, Russia

    T. I. Ivanova & V. N. Maslov

  2. AO Borovichi Refractory Combine, Borovichi, Novgorod Region, Russia

    S. I. Gershkovich, F. R. Iksanov, A. A. Kovalenko, A. V. Tsunaeva & S. A. Markelov

Authors
  1. T. I. Ivanova
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. N. Maslov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. S. I. Gershkovich
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. F. R. Iksanov
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. A. A. Kovalenko
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. A. V. Tsunaeva
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. S. A. Markelov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to T. I. Ivanova.

Additional information

Translated from Novye Ogneupory, No. 2, pp. 51 – 59, February, 2021.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Ivanova, T.I., Maslov, V.N., Gershkovich, S.I. et al. Application of X-Ray Diffraction Methods for Refractory Raw Material Quality Control. Refract Ind Ceram 62, 108–115 (2021). https://doi.org/10.1007/s11148-021-00568-7

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11148-021-00568-7

Keywords

Search

Navigation