Abstract
Tight focusing properties of axially symmetric polarized beams with fractional orders are studied theoretically based on vector diffraction theories. The mathematical expressions of focused fields are derived, which can be used to calculate the amplitude, phase and polarization distributions of focused fields. Simulation results are further shown, and many interesting patterns of focused fields are presented, which may find some potential applications in optical trapping, microscopy, near-field optics and so on. In addition, the influences of system parameters including numerical-aperture of objective lens, the beam filling factor and the beam waist factor on focused fields are analyzed, which provide more flexible modulation of focused field patterns.
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Acknowledgments
The work was supported by National Natural Science Foundation of China (Nos. 61108047 and 61475021), Beijing Natural Science Foundation (No. 4152015), the Program for New Century Excellent Talents in University, China (No. NCET-13-0667) and Beijing Top Young Talents Support Program (CIT&TCD201404113).
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Zhou, Z., Zhu, L. Tight focusing of axially symmetric polarized beams with fractional orders. Opt Quant Electron 48, 44 (2016). https://doi.org/10.1007/s11082-015-0260-9
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DOI: https://doi.org/10.1007/s11082-015-0260-9