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Microprocessor-Based System for Measuring the Modulus and Components of the Complex Resistance of a Two-Terminal Element in a Multiterminal Electrical Circuit

  • ELECTROMAGNETIC MEASUREMENTS
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Measurement Techniques Aims and scope

We propose a microprocessor-based measurement system (MBMS) for measuring the modulus and components of the complex resistance of an individual two-terminal element and the complex resistance of a two-terminal element in a branch of a multiterminal electrical circuit (MTEC) of T type or H type with one and with two points that are inaccessible for connection of the complex resistance of the two-terminal element (CRTTE). We present the block diagram for the microprocessor-based measurement system and results of the study.

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References

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Authors and Affiliations

  1. Penza State University of Architecture and Construction, Penza, Russia

    G. I. Sharonov

  2. Volgograd State Technical University, Volgograd, Russia

    A. I. Nefed’ev

Authors
  1. G. I. Sharonov
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  2. A. I. Nefed’ev
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Corresponding author

Correspondence to G. I. Sharonov.

Additional information

Translated from Izmeritel’naya Tekhnika, No.11, pp. 40–43, November, 2016.

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Sharonov, G.I., Nefed’ev, A.I. Microprocessor-Based System for Measuring the Modulus and Components of the Complex Resistance of a Two-Terminal Element in a Multiterminal Electrical Circuit. Meas Tech 59, 1191–1196 (2017). https://doi.org/10.1007/s11018-017-1114-6

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  • DOI: https://doi.org/10.1007/s11018-017-1114-6

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