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Preparation of phenylsilsesquioxane thick films using thermal softening behavior

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Abstract

Transparent films with a thickness of more than 100 μm of phenylsilsesquioxane (PhSiO3/2) were prepared via thermal softening of PhSiO3/2 gel, which was obtained by a two-step acid-base catalyzed sol–gel process. The gel was applied to a substrate and subjected to a heat treatment at 200 °C, which resulted in the thermal softening of the gel and the attainment of fluidity. Upon cooling to ambient temperature, transparent films were obtained. The hardness of the films was slightly increased through the addition of colloidal silica in the preparation of PhSiO3/2 gel, which was also synthesized via a two-step acid-base catalyzed sol–gel process. The resulting gel containing colloidal silica also displayed fluidity upon heating, and crack-free films were obtained in a larger-thickness region with the addition of SiO2 filler.

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Highlights

  • Transparent films with a thickness of more than 100 μm of phenylsilsesquioxane (PhSiO3/2) were prepared via thermal softening of PhSiO3/2 gel.

  • PhSiO3/2 gel was obtained by a two-step acid-base catalyzed sol–gel process.

  • The formation process of the thick films is basically the same as that of the ceramic glazes.

  • The hardness of the films was increased through the addition of colloidal silica.

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Acknowledgements

The present study was partly supported by JST A-STEP Grant Number JPMJTM19AH.

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KT wrote the main manuscript. YI carried out the experiments and prepared all figures. NCR-N and AM supported the experimental work, and discussed with KT and YI through this research. All authors reviewed the manuscript.

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Correspondence to Kiyoharu Tadanaga.

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Tadanaga, K., Inoue, Y., Rosero-Navarro, N.C. et al. Preparation of phenylsilsesquioxane thick films using thermal softening behavior. J Sol-Gel Sci Technol (2024). https://doi.org/10.1007/s10971-024-06332-w

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