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Sol–gel preparation and characterization of epitaxial Y0.5Ce0.5O1.75 films on biaxially-textured NiW tapes

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Abstract

High-quality Y0.5Ce0.5O1.75 films were prepared on biaxially-textured NiW tapes using sol–gel method. Y0.5Ce0.5O1.75 precursor sol was prepared using yttrium acetate and cerium 2,4-pentadionate as starting materials, propionic acid and methonal as solvents. Influence of the annealing temperature, the ion concentration and the Y/Ce mole ratio of the sol on the phase evolution, the film texture, and the film surface quality was investigated. Using the precursor sol with a low ion concentration of 0.3 mol/l, well-textured Y0.5Ce0.5O1.75 films with smooth surface were obtained on NiW tapes through an annealing process at 1,000 °C under N2 with 5 vol.% H2. The preferred c-axis orientation of the Y0.5Ce0.5O1.75 films reached a high value of 98.5 %, and the full width of half maximum of the phi scan reached an average value as low as 5.1°. The Y0.5Ce0.5O1.75 film also showed a smooth surface, with the root mean square roughness as low as 4.1 nm over 10 × 10 μm2, and 6.7 nm over 50 × 50 μm2.

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Acknowledgments

This project is supported by the National Natural Science Foundation of China (Nos. 51102195, and 51174160) and the Foundation of Science and Technology of Shaanxi Province (No. 2013KJXX-36).

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Authors and Affiliations

  1. School of Materials Science and Engineering, Xi’an University of Technology, Xi’an, 710048, China

    Yuanqing Chen, Mengjuan Li, Xinni Tang & Lajun Feng

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  1. Yuanqing Chen
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  2. Mengjuan Li
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  3. Xinni Tang
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  4. Lajun Feng
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Correspondence to Yuanqing Chen.

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Chen, Y., Li, M., Tang, X. et al. Sol–gel preparation and characterization of epitaxial Y0.5Ce0.5O1.75 films on biaxially-textured NiW tapes. J Sol-Gel Sci Technol 73, 32–37 (2015). https://doi.org/10.1007/s10971-014-3491-5

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  • DOI: https://doi.org/10.1007/s10971-014-3491-5

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