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A Novel Method for Thickness Measurement in Conducting Materials by Apparent Conductivity Calculation Through Transient Eddy Current NDE

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Abstract

This paper describes a novel method for thickness measurement in conducting material by combining the measurement of the decaying induced eddy current and its associated apparent conductivity calculation. In conventional frequency domain NDE (Non-destructive Evaluation), the skin depth is the limiting factor due to the single frequency excitation. In contrast, with a pulsed excitation, the induced eddy currents decay with time and the decay of the eddy current consists of continuum of frequencies and hence the entire thickness of the conducting material could be investigated in a single shot. The time at which the decay of the eddy current is maximum is called diffusion time “tm” and the corresponding calculated value of apparent electrical conductivity “σmapp” both of which can be directly correlated to the thickness of the material. Since the induction of the eddy current and its associated secondary magnetic field measured by using suitable magnetic sensors [hz α (σ/t)3/2 for B-field and Vz α (σ3/2/t5/2) for an induction coil] is directly related to the conductivity of the materials, one can calculate the apparent conductivity σapp(t) as a function of decay time. Apparent conductivity calculations have been made for aluminum plates based on the thin conducting sheet model in which the applied magnetic field is uniform throughout the thickness. Subsequently, transient measurements have been performed with stacks of aluminum plates by using pickup coils in the form of an absolute as well as differential configuration. From this, it has been shown that the square root of the ratio of the maximum diffusion time, tm and the corresponding apparent conductivity, σmapp called as maximum diffusion depth, δm which is proportional to the plate thickness. The diffusion depth is a parameter derived from standard electromagnetic equations which is analogous to the skin depth in the frequency domain. In this work, induction coil sensors of both types have been used to measure the transients, and the other instruments such as transmitter, transmitter controller and data acquisition system used for this work are the same ones used for TDEM (time domain electro-magnetic) based geophysical applications.

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Acknowledgements

The authors would like to thank Shri R. Baskaran, Dr. N.V. Chandra Shekar, and Dr. Shaju K. Albert for their continuous support and encouragement in this work. The authors would also like to thank Shri R. Bharath for his support in the field throughout this work.

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  1. Materials Science Group, Indira Gandhi Centre for Atomic Research, Homi Bhabha National Institute, Kalpakkam, 603102, India

    R. Nagendran, Lata Bisht & Ijee Mohanty

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  1. R. Nagendran
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  2. Lata Bisht
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  3. Ijee Mohanty
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Correspondence to R. Nagendran.

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Nagendran, R., Bisht, L. & Mohanty, I. A Novel Method for Thickness Measurement in Conducting Materials by Apparent Conductivity Calculation Through Transient Eddy Current NDE. J Nondestruct Eval 40, 30 (2021). https://doi.org/10.1007/s10921-021-00762-0

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