Abstract
In this study, MoTe2/Sb heterojunction films were fabricated through alternating deposition of MoTe2 and Sb materials, and their properties were thoroughly examined. When compared to single-layer Sb films, the MoTe2/Sb heterojunction films exhibited a higher crystallization temperature (∼ 180.5 °C), an improved 10-year data retention temperature (∼ 97.41 °C), and a greater crystallization activation energy (∼ 2.81 ± 0.16 eV), indicating superior thermal stability. Near-infrared spectrophotometry revealed that the band gap of the crystalline MoTe2/Sb heterojunction films was wider than that of Sb films. Furthermore, X-ray diffractometer analysis demonstrated that the MoTe2 layer inhibited grain growth in Sb, resulting in smaller grain sizes. Atomic force microscopy observations revealed that the surface of MoTe2/Sb heterojunction films was smoother than that of single-layer Sb films. Phase change memory devices utilizing MoTe2/Sb heterojunction films demonstrated the reversible SET-RESET conversion across various pulse widths with lower operating power consumption compared to single-layer Sb films. These results demonstrate that the properties of Sb films can be effectively modulated through the MoTe2 heterojunction, yielding phase change materials with exceptional overall performance.
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Lu, Y. Study on the modulation of sb phase change thin films and device properties by MoTe2 heterojunction layer. J Mater Sci: Mater Electron 35, 937 (2024). https://doi.org/10.1007/s10854-024-12689-z
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DOI: https://doi.org/10.1007/s10854-024-12689-z