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Influence of the electric field and annealing temperature on flash-sintered (Mg1/3Nb2/3)0.05Ti0.95O2 ceramics

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Abstract

(Mg, Nb) co-doped TiO2 colossal dielectric ceramics were successfully prepared at 1200 °C for 24 min. The effects of different electric field on phase structure, microstructure and dielectric properties have been systematically studied. All the flash sintered samples were pure rutile TiO2 structure, and no second phase was produced. With the increase of electric field, the dielectric constant (at 1 kHz) firstly increases and then decreases. When the electric field is 550 V/cm, the dielectric properties (ε′ ≈ 6.0 × 105, tanδ ≈ 0.73) of the ceramic sample are the best. Flash sintered samples were annealed at different temperatures (800–1000 °C) in order to reduce dielectric loss. As the annealing temperature increases, the dielectric constant decreases gradually. When the annealing temperature is 800 °C, the dielectric constant of the ceramic sample is about 7.1 × 104 and the dielectric loss is about 0.37 (twice reduced) at 1 kHz. Impedance spectroscopy (IS) data indicated that ceramics consist of semi-conductive grains and insulated grain boundaries. This good dielectric property was attributed to the internal barrier layer capacitance (IBLC) effect.

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Data availability

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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Funding

This work was financially supported by Key Scientific Research Project of University in Anhui Province (2023AH040124) and Key Research and Development and Achievement Transformation Project of Science and Technology Projects in Wuhu City (2023yf032).

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Authors and Affiliations

  1. School of Materials Science and Engineering, East China Jiaotong University, Nanchang, 330013, China

    Hua Man

  2. Anhui Dongxun Sealing Technology Co., Ltd, Wuhu, 241000, China

    Xi Wang & Zhentao Wang

  3. Wuhu Lingyi Precision Tools Manufacturing Co., Ltd, Wuhu, 241000, China

    Changjin Liu

  4. School of Materials Science and Engineering, Anhui Polytechnic University, Wuhu, 241000, China

    Zhentao Wang, Liang Zhang, Chunxia Zhang & Dong Xu

Authors
  1. Hua Man
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  2. Xi Wang
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  3. Changjin Liu
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  4. Zhentao Wang
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  5. Liang Zhang
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  6. Chunxia Zhang
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  7. Dong Xu
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Contributions

HM: Methodology, Design, Investigation, Preparation, Writing. XW: Experiment, Investigation. CL: Experiment, Analyzing. ZW: Investigation, Preparation, Writing. LZ: Analyzing, Data curation. CZ: Experiment, Analyzing. DX: Conceptualization, Guiding, Review, Supervision. All authors read the paper and commented on the text.

Corresponding author

Correspondence to Dong Xu.

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Man, H., Wang, X., Liu, C. et al. Influence of the electric field and annealing temperature on flash-sintered (Mg1/3Nb2/3)0.05Ti0.95O2 ceramics. J Mater Sci: Mater Electron 35, 875 (2024). https://doi.org/10.1007/s10854-024-12656-8

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