Abstract
The CuO nanoparticles prepared by high yielding, eco-friendly, non-hazardous, cost-effective, and simple Exploding Wire Technique and subsequently subjected to annealing at 900 °C for 7 h were analyzed through a series of characterization techniques. X-ray diffraction data analysis was performed to determine the crystallite phase and size of CuO at 900 °C. The direct current (DC) electrical attributes of synthesized nanoparticles were measured using two-probe system in the span of 300–512 K. The activation drive for hopping of charge carriers, drift mobility, and carrier density were evaluated through DC investigation. The traits of dielectric responses like dielectric constant or relative permittivity (ε′), tangent loss (tan δ), dielectric loss (ε″) and alternating current (AC) conductivity (σAC) were investigated at different thermal states in the frequency span of 10–105 Hz. The surge in AC conductivity with frequency, as detected in the present case, represents typical behavior of spinel ferrite. The alteration in relative permittivity with frequency could be acceptably explicated through two-layer model formulated on space charge polarization. The dielectric properties at various frequencies were investigated in the temperature span of 300–500 K. The reduction in DC resistivity along with the surge in AC conductivity with temperature acknowledged the semiconducting essence of synthesized CuO nanoparticles.
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Acknowledgements
The author Navendu Goswami acknowledges the Core Research Grant received by SERB-DST, India CRG/2021/006804. Surendra Singh is grateful to Meerut Institute of Engineering and Technology, Meerut for encouraging the research work.
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Conceptualization: SS and NG; Methodology: SS and NG; Formal analysis and investigation: SS; Writing and original draft preparation: SS; Writing, reviewing, and editing of the manuscript: NG. Both authors read and approved the final manuscript.
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Singh, S., Goswami, N. Dielectric study of pure CuO nanoparticles prepared through exploding wire technique. J Mater Sci: Mater Electron 34, 182 (2023). https://doi.org/10.1007/s10854-022-09628-1
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DOI: https://doi.org/10.1007/s10854-022-09628-1