Abstract
Anodized aluminum oxide (AAO) in amorphous form is shown to be a prospective phosphor for optically stimulated luminescence (OSL) by implanting 50 keV carbon ions at a fluence of 1 × 1016 ions/cm2 at room temperature. An almost 20-fold enhancement in continuous wave OSL (CW-OSL) sensitivity is obtained in carbon-doped AAO (C:AAO) by exposing to beta radiation, while an almost linear increase in CW-OSL intensity is recorded with increasing dose from 0.3 to 5 Gy. However, cathodoluminescence (CL) suggests an upsurge of oxygen vacancies, especially F+ and F22+ centers, at the cost of F center-related defects in C:AAO. Detailed X-ray photoelectron spectroscopy (XPS) analysis further reveals that the implanted carbon atoms can act as cationic impurities in AAO and stabilize the nearby F+ centers via substitution of Al3+ by C2+. The combined CL and XPS results are also shown to be capable of illustrating the CW-OSL response. This study would, therefore, be a benchmark for understanding the role of carbon in the substitutional sites of AAO for generating OSL active electron traps.
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The data that support the findings of this study are available from the corresponding author upon reasonable request.
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Acknowledgements
The authors would like to acknowledge the financial support received from the Shiv Nadar University and DAE-BRNS, India under the project No. 34/14/24/2016-BRNS/34365. Mrs. K. D. Devi from IUAC, New Delhi is highly acknowledged for her kind help during ion implantation. The authors, especially SB and SP, would also acknowledge the active participation of Mr. D. Dey, SINP India during CL measurements.
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Bhowmick, S., Pal, S., Singh, A. et al. Carbon doping-induced defect centers in anodized alumina with enhanced optically stimulated luminescence. J Mater Sci: Mater Electron 32, 10635–10643 (2021). https://doi.org/10.1007/s10854-021-05719-7
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DOI: https://doi.org/10.1007/s10854-021-05719-7