Abstract
Calcium copper titanate (CaCu3Ti4O12, CCTO), thin films with polycrystalline nature have been deposited by RF sputtering on Pt/Ti/SiO2/Si (100) substrates at a room temperature followed by annealing at 600 °C for 2 h in a conventional furnace. The CCTO thin film present a cubic structure with lattice parameter a = 7.379 ± 0.001 Å free of secondary phases. Dielectric spectroscopy was employed to examine the polycrystalline behaviour of CCTO material and the mechanisms responsible for the barrier-layer capacitances associated with Schottky-type barriers and the non-Ohmic properties. The film presents an electric breakdown field (Eb = 203 V cm−1) and then nonlinear coefficient (α = 6), which is even lower than that of the ZnO and SnO2 based varistors The observed electrical features of CCTO thin films are highly dependent on the [CaO12], [CaO4], [CuO11], [CuO11Vo x] and [TiO5·\(V_{O}^{ \bullet }\)] clusters.
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References
D.R. Clarke, Varistor ceramics. J. Am. Ceram. Soc. 82, 485–502 (1999)
S.Y. Chung, I. Kim, S.L. Kang, Strong nonlinear current–voltage behaviour in perovskite-derivative calcium copper titanate. Nat. Mater. Lett. 3, 774–776 (2004)
D.C. Sinclair, T.B. Adams, F.D. Morrison, A.R. West, CaCu3Ti4O12: one-step internal barrier layer capacitor. Appl. Phys. Lett. 80, 2153–2155 (2002)
L. Mei, H. Hsiang, Effect of copper-rich secondary phase at the grain boundaries on the varistor properties of CaCu3Ti4O12 ceramic. J. Am. Ceram. Soc. 91, 3735–3737 (2008)
J. Li, M.A. Subramanian, H.D. Rosenfeld, C.Y. Jones, B.H. Toby, A.W. Sleight, Clues to the giant dielectric constant of CaCu3Ti4O12 in the defect structure of SrCu3Ti4O12. Chem. Mater. 16, 5223–5225 (2004)
T.B. Adams, D.C. Sinclair, A.R. West, Decomposition reactions in CaCu3Ti4O12 ceramics. J. Am. Ceram. Soc. 89, 2833–2838 (2006)
S.Y. Chung, I.D. Kim,S.J.L. Kang, Strong nonlinear current–voltage behaviour in perovskite-derivative calcium copper titanate. Nat. Mater. 3, 774–778 (2004)
C.C. Homes, T. Vogt, S.M. Shapiro, S. Wakimoto, M.A. Subramanian, A.P. Ramirez, Charge transfer in the high dielectric constant materials CaCu3Ti4O12 and CdCu3Ti4O12. Phys. Rev. B 67, 092106 (2003)
L. He, J.B. Neaton, M.H. Cohen, D. Vanderbilt, C.C. Homes, First-principles study and lattice dielectric response of CaCu3Ti4O12. Phys. Rev. B 65, 214112 (2002)
E.R. Leite, A.M. Nascimento, P.R. Bueno, E. Longo, J.A. Varela, The influence of sintering process and atmosphere on the non-ohmic properties of SnO2 based varistor. J. Mater. Sci. Mater. Electron. 10, 321–327 (1999)
V.C. Sousa, M.R. Cássia-Santos, C.M. Barrado, M.R.D Bomio, E.R. Leite, J.A. Varela, E. Longo, Effect of atmosphere on the electrical properties of TiO2–SnO2 varistor systems. J. Mater. Sci. Mater. Electron. 15, 665–669 (2004)
S.Y. Chung, I.D. Kim, S.J.L. Kang, Strong nonlinear current–voltage behaviour in perovskite-derivative calcium copper titanate. Nature 3, 774 (2004)
R.A. Young, A. Sakthivel, T.S. Moss, C.O. Paiva-Santos, DBWS-9411—an upgrade of the DBWS*.* programs for Rietveld refinement with PC and mainframe computers. J. Appl. Crystallogr. 28, 366–367 (1995)
P. Jha, P. Arora, A.K. Ganguli, Polymeric citrate precursor route to the synthesis of the high dielectric constant oxide CaCu3Ti4O12. Mater. Lett. 57, 2443–2446 (2003)
C.R. Foschini, Tararam R., A.Z. Simões, L.S. Rocha, C.O.P. Santos, E. Longo, J.A. Varela, Rietveld analysis of CaCu3Ti4O12 thin films obtained by RF-sputtering. J. Mat. Sci. Mat. Electron. 27(1), 2175–2182 (2016)
T. Li, R. Xue, J. Hao, Y. Xue, Z. Chen, The effect of calcining temperatures on the phase purity and electric properties of CaCu3Ti4O12 ceramics. J. Alloy Compd. 509(3), 1025–1028 (2011)
C.R. Foschini, R. Tararam, A.Z. Simões, M. Cilense, E. Longo, J.A. Varela, CaCu3Ti4O12 thin films with non-linear resistivity deposited by RF-sputtering113, J. Alloy Compd. 574, 604–608 (2013)
J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, Handbook of X-ray Photoelectron Spectroscopy, (Perkin-Elmer Corporation, Physical Electronis Division, Eden Prairie, 1992)
P.R. Bueno, R. Tararam, P. Parra, E. Joanni, J.A. Varela, A polaronic stacking fault defect model for CaCu3Ti4O12 material: an approach for the origin of the huge dielectric constant and semiconducting coexistent features. J. Phys. D Appl. Phys. 42(5), 1–9 (2009)
G. Deng, N. Xanthopoulos, P. Muralt, Chemical nature of colossal dielectric constant of CaCu3Ti4O12 thin film by pulsed laser deposition. Appl. Phys. Lett. 92, 172909 (2008)
L. Ramajo, R. Parra, J.A. Varela, M.M. Reboredo, M.A. Ramirez, M.S. Castro, Influence of vanadium on electrical and microstructural properties of CaCu3Ti4O12/CaTiO3. J. Alloy Compd. 497, 349–353 (2010)
R. Parra, R. Savu, L.A. Ramajo, M.A. Ponce, J.A. Varela, M.S. Castro, P.R. Bueno, E. Joanni, Sol–gel synthesis of mesoporous CaCu3Ti4O12 thin films and their gas sensing response. J. Solid State Chem. 183, 1209 (2010)
P.R. Bueno, R. Tararan, R. Parra, E. Joanni, M.A. Ramírez, W.C. Ribeiro, E. Longo, J.A. Varela, A polaronic stacking fault defect model for CaCu3Ti4O12 material: an approach for the origin of the huge dielectric constant and semiconducting coexistent features. J. Phys. D Appl. Phys. 42, 055404 (2009)
T.T. Fang, C.P. Liu, Evidence of the internal domains for inducing the anomalously high dielectric constant of CaCu3Ti4O12. Chem. Mater. 17, 5167–5171 (2005)
J. Li, A.W. Sleight, M.A. Subramanian, Evidence for internal resistive barriers in a crystal of the giant dielectric constant material: CaCu3Ti4O12. Solid State Commun. 135, 260–262 (2005)
A.K. Jonscher, Dielectric characterisation of semiconductors. Solid State Electron. 33, 737 (1990)
P.R. Bueno, E.R. Leite, M.M. Oliveira, M.O. Orlandi, E. Longo, Role of oxygen at the grain boundary of metal oxide varistors: a potential barrier formation mechanism. Appl. Phys. Lett. 79, 48–50 (2001)
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The financial support of this research project by the Brazilian research funding agency FAPESP (Grant No. 2013/07296-2) is gratefully acknowledged.
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Foschini, C.R., Hangai, B., Cavalcante, C.S. et al. Non-ohmic properties of CaCu3Ti4O12 thin films deposited By RF-sputtering. J Mater Sci: Mater Electron 28, 15685–15693 (2017). https://doi.org/10.1007/s10854-017-7458-5
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DOI: https://doi.org/10.1007/s10854-017-7458-5