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Large piezoelectric properties of (1 − x)Na0.5Bi0.5TiO3–xBaTiO3 thin films prepared by sol–gel method

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Abstract

(1 − x)Na0.5Bi0.5TiO3–xBaTiO3 (BNT–xBT) thin films with x = 0, 0.04, 0.06, 0.08 were prepared on Pt(111)/Ti/SiO2/Si substrates via water-based sol–gel method. A new crystallization process called stepwise crystallization was used to obtain pure perovskite phase observed by XRD. Piezoelectric property and ferroelectric property of BNT–xBT thin films are investigated, and BNT–BT0.06 shows best piezoelectric and ferroelectric properties among the different compositions. The maximum strain value of 1.4–1.8 % and d 33 of 83 pm/V are observed for BNT–BT0.06 thin films. AFM and PFM images reveal the dense morphology and large piezoresponse of BNT–BT thin films without orientation.

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Acknowledgments

The work was supported by Ministry of Sciences and Technology of China through National Basic Research Program of China (973 Program 2015CB654604), National Natural Science Foundation of China for Creative Research Groups (Grant No. 51221291), National Natural Science Foundation of China (Grant No. 51272123), and also supported by CBMI Construction Co., Ltd.

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  1. State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing, 100084, China

    Wenhan Cui, Xiaohui Wang & Longtu Li

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  1. Wenhan Cui
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  2. Xiaohui Wang
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Correspondence to Xiaohui Wang.

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Cui, W., Wang, X. & Li, L. Large piezoelectric properties of (1 − x)Na0.5Bi0.5TiO3–xBaTiO3 thin films prepared by sol–gel method. J Mater Sci: Mater Electron 27, 7287–7291 (2016). https://doi.org/10.1007/s10854-016-4696-x

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