Abstract
Doping of Bi2O3 has been considered to be the essential condition for ZnO varistors. But there have always been found that Bi2O3 second phases concentrated at grain boundaries will have great effects on electrical properties. We find that the Cr2O3 doping has positive effects on the substitution of Bi3+ into the lattice of ZnO varistor films. With the Cr2O3 doping, the XRD peak intensity of Bi2O3 second phase decreased. And the Bi2O3 peak disappears when the content of the Cr reached 0.3 mol%. Meanwhile, the lattice parameter increases with the Cr2O3 doping. We think those may be caused by the promoted lattice entering of Bi3+ through Cr2O3 doping. The dielectric and varistor properties of ZnO varistor films were greatly improved by Cr2O3 doping. The obvious effects of Cr2O3 doping on the microstructure and electrical properties suggest good candidate of Cr2O3 as the dopant for ZnO–Bi2O3 based varistor films.
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Acknowledgments
This work was financially supported by the Cooperative Innovation Foundation of Jiangsu Province (BY2014123-02), the Tribology Science Fund of State Key Laboratory of Tribology (SKLTKF13B08) and Changzhou science and technology Program (CC20140002, CQ20140006).
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Xu, D., He, K., Chen, B.H. et al. Effects of Cr2O3 doping on the microstructural and electrical properties of ZnO–Bi2O3 based varistor films. J Mater Sci: Mater Electron 26, 7909–7913 (2015). https://doi.org/10.1007/s10854-015-3443-z
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DOI: https://doi.org/10.1007/s10854-015-3443-z