An x-ray fluorescence analysis procedure has been proposed for determining the mass absorption coefficient in two-layer Co/Cr thin-film systems on polikor substrates. Easy-to-make thin-film layers of sputtered cobalt on a polymer film substrate were used. Correction coefficients were calculated that take into account the attenuation of the primary radiation of the x-ray tube and the absorption intensity of the analytical line of the bottom layer element in a top layer.
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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 89, No. 5, 668–673, September–October, 2022. https://doi.org/10.47612/051475062022895668673.
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Cherniaeva, E.A., Kniazeva, A.A., Kochetkova, I.S. et al. X-Ray Fluorescence Determination of the Mass Absorption Coefficient in Two-Layer Co/Cr Thin-Film Systems. J Appl Spectrosc 89, 874–878 (2022). https://doi.org/10.1007/s10812-022-01441-2
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DOI: https://doi.org/10.1007/s10812-022-01441-2