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Effective Thermal Conductivity Measurement of Additively Manufactured Lattice Structures by Application of Modified Temperature Profile Method

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Abstract

This study aims to establish a general-purpose thermal conductivity measurement method that can take into account the effect of heat loss under atmospheric conditions for measuring the effective thermal conductivity of lattice structures, and to clarify the effective thermal conductivity of lattice structures with different wire diameters. In this paper, calculations by finite element method and measurements using steady state comparative-longitudinal heat flow method and modified temperature profile method were performed to clarify the effective thermal conductivity of the five truncated octahedron unit-cell lattice structures with different wire diameters fabricated by additive manufacturing. The modified temperature profile method is developed to take into account the effect of interfacial thermal resistance in the measurement apparatus. The effective thermal conductivity measured using the steady state comparative-longitudinal heat flow method and calculated with finite element method analysis showed good agreement, confirming that the effective thermal conductivity is strongly dependent on the wire diameter. The effective thermal conductivity obtained by the modified temperature profile (MTP) method was 3 % to 24 % smaller than that obtained by the steady state comparative-longitudinal heat flow method, and the measurement was able to take heat loss into account more concretely. Furthermore, measurements using the MTP method enabled us to obtain reasonable values for the ratio of heat loss in each section, the fin efficiency of the sample, the heat transfer coefficient to the surroundings, and the interfacial thermal resistance between the rods and the sample.

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Data Availability

The datasets generated during and analyzed during the current study are available from the corresponding author on reasonable request.

Abbreviations

\(Q_{R}\) :

Amount of heat flow of rod (W)

\(k_{R}\) :

Thermal conductivity of rod (W⋅m1⋅K1)

\(A_{R}\) :

Cross-sectional area of rod (m2)

\(Q_{UR}\) :

Amount of heat flow of upper rod (W)

\(Q_{LR}\) :

Amount of heat flow of lower rod (W)

\(k_{eff}\) :

Effective thermal conductivity of sample for conventional method (W⋅m1⋅K1)

\(A_{S}\) :

Cross-sectional area of sample (m2)

\(Q_{C}\) :

Amount of heat flow through interface (W)

\(A_{g}\) :

Contact area of the interface (m2)

\(k_{exp}\) :

Effective thermal conductivity of sample for MTP method (W⋅m1⋅K1)

\(T_{UC}\) :

Temperature difference of upper cartridge block from the surroundings (K)

\(T_{LC}\) :

Temperature difference of lower cartridge block from the surroundings (K)

\(Q_{SLOS}\) :

Heat loss from sample to the surroundings (W)

\(Q_{ULOS}\) :

Heat loss from the rod and cartridge blocks at the upper side of the sample to the surroundings (W)

\(Q_{LLOS}\) :

Heat loss from the rod and cartridge blocks at the lower side of the sample to the surroundings (W)

\(S_{S}\) :

Surface area of the sample (m2)

\(S_{R}\) :

Surface area of the rod (m2)

\(S_{C}\) :

Surface area of the cartridge block (m2)

\(h\) :

Heat transfer coefficient giving the heat loss to the surroundings (W⋅m2⋅K1)

\(\phi\) :

Fin efficiency (–)

\(T_{US}\) :

Temperature difference of upper surface of the sample from the surroundings (K)

\(T_{LS}\) :

Temperature difference of lower surface of the sample from the surroundings (K)

\(Q_{LOS}\) :

Total heat loss to the surroundings (W)

\(R_{C}\) :

Interfacial thermal resistance of upper and lower interface of sample in case of assuming the interfacial thermal resistance of the upper and lower interface is the same for MTP method (km2⋅W1)

\(Q_{UC}\) :

Amount of heat flow into sample (W)

\(Q_{LC}\) :

Amount of heat flow out of sample (W)

\(t_{C}\) :

Thickness of cartridge block (m)

\(k_{C}\) :

Thermal conductivity of cartridge block (W⋅m1⋅K1)

\(A_{C}\) :

Cross-sectional area of cartridge block (m2)

\(T_{x}\) :

Temperature rise profile in the direction of heat flow in the sample (K)

\(L_{S}\) :

Thickness of sample (m)

\(x\) :

Axial position on sample (m)

\(m^{ - 1}\) :

Thermal healing length (m)

\(P_{S}\) :

Perimeter of sample (m)

\(R^{2}\) :

Coefficient of determination (–)

\(T_{s1}\) :

Temperature raise of the measurement point closest to the upper rod at the sample (K)

\(T_{s3}\) :

Temperature raise of the measurement point closest to the lower rod at the sample (K)

\(x_{s1}\) :

Position of the measurement point closest to the upper rod at the sample (m)

\(x_{s3}\) :

Position of the measurement point closest to the lower rod at the sample (m)

\(R_{U}\) :

Interfacial thermal resistance between upper rod and sample in case of assuming the interfacial thermal resistance of the upper and lower interface is different for MTP method (m2⋅K1⋅W1)

\(R_{L}\) :

Interfacial thermal resistance between sample and lower rod in case of assuming the interfacial thermal resistance of the upper and lower interface is different for MTP method (m2⋅K1⋅W1)

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Contributions

RU: Conceptualization, Methodology, Investigation, Formal analysis, preparing figures, Writing—Original Draft. AU: Investigation, Resources, Writing—Review & Editing. HN: Conceptualization, Resources, Writing—Review & Editing, Funding acquisition. MO: Preparing test specimens, Review & Editing. TO: Conceptualization, Methodology, Supervision, Review & Editing.

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Correspondence to Hosei Nagano.

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Umemoto, R., Ueno, A., Nagano, H. et al. Effective Thermal Conductivity Measurement of Additively Manufactured Lattice Structures by Application of Modified Temperature Profile Method. Int J Thermophys 44, 95 (2023). https://doi.org/10.1007/s10765-023-03206-1

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