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Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method

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The spectral-domain volume integral equation is used to develop a computer model for investigating the scattering properties of plane objects in the form of elliptical cylinders embedded in a dielectric wafer. The features of the model are demonstrated for particles of different materials and different shapes.

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References

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Authors and Affiliations

  1. Faculty of Computational Mathematics and Cybernetics, Moscow State University, Moscow, Russia

    V. V. Lopushenko

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  1. V. V. Lopushenko
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Correspondence to V. V. Lopushenko.

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Translated from Prikladnaya Matematika i Informatika, No. 51, 2016, pp. 81–94.

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Lopushenko, V.V. Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method. Comput Math Model 28, 60–73 (2017). https://doi.org/10.1007/s10598-016-9345-y

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  • DOI: https://doi.org/10.1007/s10598-016-9345-y

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