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Metaheuristic-based time series clustering for anomaly detection in manufacturing industry

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Abstract

Nowadays time series clustering is of great importance in manufacturing industries. Meanwhile, it is considerably challenging to achieve explainable solution as well as significant performance due to computation complexity and variable diversity. To efficaciously handle the difficulty, this paper presents a novel metaheuristic-based time series clustering method which can improve the effectiveness and logicality of existing clustering approaches. The proposed method collects candidate cluster references from hierarchical and partitional clustering through shape-based distance measure as well as dynamic time warping (DTW) on manufacturing time series data. By applying metaheuristics highlighting estimation of distribution algorithms (EDA), such as extended compact genetic algorithm (ECGA), on the collected candidate clusters, advanced cluster centroid combinations with minimal distances can be achieved. ECGA employs the least complicated and the most closely related probabilistic model structure regarding population space during generation cycle. This feature strengthens the comprehension of clustering results in how such optimal solutions were achieved. The proposed method was tested on real-world time series data, open to the public, from manufacturing industry, and showed noticeable performances compared to well-established methods. Accordingly, this paper demonstrates that obtaining both comprehensible result as well as prominent performance is feasible by employing metaheuristic techniques to time series data clustering methods.

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Funding

This work was supported by IITP grant funded by the Korea government (MSIT)(No. 2019-0-01842, Artificial Intelligence Gradate School Program (GIST)), and the National Research Foundation of Korea(NRF) funded by the Ministry of Education (NRF-2021R1A2C3013687)

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Suh, W.H., Oh, S. & Ahn, C.W. Metaheuristic-based time series clustering for anomaly detection in manufacturing industry. Appl Intell 53, 21723–21742 (2023). https://doi.org/10.1007/s10489-023-04594-5

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