Abstract
This paper presents a high-linearity pixel readout circuit and a 10-bit ADC for using in CMOS image sensor. Nonlinearity, total input referred noise power, and power consumption of the proposed readout circuit are − 60 dB, 411 nV2, and 68 µW, respectively. The proposed pixel readout circuit is suitable for use in precision CMOS imagers. All circuits have been designed using TSMC 0.18 µm 1-poly 6-metal standard CMOS process.
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References
Nakamura, J. (2006). Image sensors and signal processing for digital still cameras. Boca Raton: CRC Press.
Ohta, J. (2008). Smart CMOS Image Sensors and Applications. Boca Raton: CRC Press.
Salama, K., & El Gamal, A. (2003). Analysis of active pixel sensor readout circuit. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications,50, 941–945.
Perenzoni, M., Massari, N., Stoppa, D., Pancheri, L., Malfatti, M., & Gonzo, L. (2011). A 160 times 120-pixels range camera with in-pixel correlated double sampling and fixed-pattern noise correction. IEEE Journal of Solid State Circuits,46, 1672–1681.
Yonemoto, K., & Sumi, H. (2002). A numerical analysis of a CMOS image sensor with a simple fixed-pattern-noise-reduction technology. IEEE Transactions on Electron Devices,49, 2038–2043.
Razavi, B. (1995). Principles of data conversion system design. Piscataway: IEEE Press.
Xianping, F., & Chan, P. K. (2005). Analysis and design of low-distortion CMOS source followers. IEEE Transactions on Circuits and Systems I: Regular Papers,52(8), 1489–1501.
Ge, X., & Theuwissen, A. (2016). A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier. In IEEE Sensors.
Giacomini, G., Bosisio, L., Dalla Betta, D., Mendicino, R., & Ratti, L. (2015). Integrated source follower for the read-out of silicon sensor arrays. IEEE Transactions on Nuclear Science,62, 2187–2193.
Teymouri, M., & Sobhi, J. (2018). An ultra-linear CMOS image sensor for a high-accuracy imaging system. International Journal of Circuit Theory and Applications,46, 1593–1605.
El Gamal, A., & Eltoukhy, H. (2005). CMOS image sensor. IEEE Circuits & Devices Magazine,21, 6–20.
Oike, Y., Akiyama, K., Hung, L. D., Niitsuma, W., Kato, A., Sato, M., et al. (2017). 8.3 M-pixel 480-fps global-shutter CMOS image sensor with gain-adaptive column ADCs and chip-on-chip stacked integration. IEEE Journal of Solid-Sate Circuits,52, 985–993.
Muung, S., Masayuki, I., Junichi, M., & Eiichi, S. (2010) Column parallel single-slope ADC with time to digital converter for CMOS imager. In 17th IEEE international conference on electronics, circuits and systems.
Chen, N., Zhong, S., Zou, M., Zhang, J., Ji, Z., & Yao, L. (2018). A low-noise CMOS image sensor with digital correlated multiple sampling. IEEE Transactions on Circuits and Systems—I: Regular Papers,65, 84–94.
Teymouri, M., & Sobhi, J. (2018). A FHD 1080, 120 fps CMOS image sensor with two step SS-ADC. Analog Integrated Circuits and Signal Processing,99, 339–347.
Tsai, T., & Hornsey, R. (2012). 1.25 V supply 0.72 V output voltage swing two-step readout CMOS active pixel architecture. IEEE Sensors Journal,12, 3277–3284.
Li, Z., Wang, X., Li, B., & Chang, Y. (2016). 160 dB dynamic range pixel with charge compensation for CMOS image sensor. Electronics Letters,52, 819–821.
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Teymouri, M. A highly linear and high-accurate CMOS image sensor. Analog Integr Circ Sig Process 102, 91–96 (2020). https://doi.org/10.1007/s10470-019-01553-4
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DOI: https://doi.org/10.1007/s10470-019-01553-4