Abstract
Magnesium fluoride (MgF2) thin films deposited using atomic layer deposition (ALD) were studied for use as optical coatings, meta-surface anti-reflection layer, and chemically resistive passivation. The deposition was performed in a commercially available Picosun® R-200 Advanced ALD reactor. Characterization of composition, density, optical property, chemical resistivity and coverage were performed. ALD-deposited films showed high R + T at wavelength down to 350 nm, excellent 3D coverage, and high chemical resistivity. This technology enables unique properties to improve 3D structured optics such as metasurface.
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Sugai, Y., Sugata, H., Sugawara, T. et al. Optical, chemical and coverage properties of magnesium fluoride formed by atomic layer deposition. Opt Rev (2024). https://doi.org/10.1007/s10043-024-00867-7
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DOI: https://doi.org/10.1007/s10043-024-00867-7