Abstract
Accurate measurement of nano-electromechanical system (NEMS) resonator is difficult due to parasitic effect, piezoresistive effect and etc. In order to get higher measurement precision, detailed studies are needed to learn and understand its behavior under alternating mechanical stress during NEMS resonance. Devices with nano TFT channel have been fabricated and tested to study the effects of the alternating mechanical stress on the resonators. The TFT channel is nano scale in vertical direction normal to the device plane. After applying alternating mechanical stress, output curve shift is observed. It is found that the drift is enlarged with the increase of vibrating frequency and decrease of vibrating amplitude. It is assumed from experimental results that internal friction is the major factor of generating trapped electron and charge in the silicon-insulator interface. The phenomenon can be used to further understand the behavior and calibrate the measurement of NEMS resonators later.
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References
Agache V, Legrand B, Collard D, Fujita H, Buchaillot L (2005) 1.1 GHz silicon blade nano-electromechanical resonator featuring 20 nm gap lateral transducers. In: 18th IEEE international conference on micro electro mechanical systems (MEMS 2005: Technical Digest). Miami, pp 121–124
Chang W-T, Wang C-C, Lin J-A, Yeh W-K (2010) External stresses on tensile and compressive contact etching stop layer SOI MOSFETs. IEEE Trans Electron Dev 57(8):1889–1894
Huiquan W (2008) Study of NEMS resonator based on field effect transistor detection. [M]PhD Thesis Zhejiang University
Lochtefeld A, Antoniadis DA (2001) Investigating the relationship between electron mobility and velocity in deeply scaled NMOS via mechanical stress. IEEE Electron Dev Lett 22(12):591–593
Moselund KE, Najmzadeh M, Dobrosz P, Olsen SH, Bouvet D, De Michielis L, Pott V, Ionescu AM (2010) The high-mobility bended n-channel silicon nanowire transistor. IEEE Trans Electron Devices 57(4):866–876
Nathanso Hc, Newell WE, Wickstro RA, Davis JR (1967) Resonant gate transistors. IEEE Trans Electron Devices 14:117–133
Pantelides ST, Lang M (1978) The Physics of SiO2 and its Interfaces. Pergamon, New York, p 339
Revesz AG (1973) Noncrystalline silicon dioxide films on silicon: A review. J. Noncryst Solids 11(4):309–330
Scott SV, Harold GC, Jeevak MP (2008) A megahertz nanomechanical resonator with room temperature quality factor over a million. Appl Phys Lett 92(1):013112-013112-3
Zener C (1949) Relaxation phenomena in metals. Physica 15(1–2):111–118
Acknowledgments
This work was supported in part by the “Natural Science Foundation of zhejiang province No. Q13F040001”, the “National Science Foundation of China No. 61404122”.
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Ma, T., Liu, Y. Characteristics of threshold-voltage shifts for nano p-TFT under alternating mechanical stress. Microsyst Technol 22, 841–845 (2016). https://doi.org/10.1007/s00542-015-2456-0
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DOI: https://doi.org/10.1007/s00542-015-2456-0