Abstract
Since the ancient times, free-hand sketch has been widely used as an effective and convenient intermediate means to express human thoughts and highly diverse objects in reality. In recent years, a great quantity of researchers realized the significance of sketch and gradually focused on sketch-related problems, such as sketch-based image retrieval and recognition. Despite so many achievements, very few works concentrate on exploring the intrinsic factors which potentially influence the vivid degree of sketch. In this paper, we propose a weak supervised approach to discover the most discriminative patches for different categories of sketches, which perhaps grasp the key to a good free-hand sketch. In the beginning, we randomly extract tens of thousands of patches at multiple scales. After that, pyramid histogram of oriented gradient is calculated to represent these patches as an effective and uniform feature representation. To find the most discriminative patches for each class of sketches, we design an iterative detection process which combines cluster merging and discriminative ranking. The experimental results on the TU-Berlin sketch benchmark dataset demonstrate the effectiveness of the proposed method, as compared to other available approaches. Moreover, a reasonable analysis and discussion about good and bad sketches is provided based on the visual results.
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Acknowledgments
This work was supported by the National Natural Science Foundation of China (No. 61472103) and Key Program (No. 61133003).
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Zheng, Y., Yao, H., Zhao, S. et al. Discovering discriminative patches for free-hand sketch analysis. Multimedia Systems 23, 691–701 (2017). https://doi.org/10.1007/s00530-016-0507-8
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DOI: https://doi.org/10.1007/s00530-016-0507-8