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Axial scanning in lensless microscopy to achieve high resolution

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Abstract

The optical system is designed here, to miniaturize the mechanical scanning and number of phase patterns illumination in lensless microscopy. The random phase mask is positioned in vertical column before the sample, which encoded the sample information and resulted into a final image at the sensor plane. To improve the signal to noise ratio and resolution of final image, the axial direction scanning of sample and sensor (SS) is performed while keeping them mutually immovable. This operation gathered the lost information of sample in between the sample and sensor planes. This axial motion of SS is performed with periodic steps, which would help in the reconstruction process during post processing. The final image has resolution of about 4 µm and field of view of 15 mm2. There are numerous advantages of such type of techniques, including portability and fast processing of data.

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Acknowledgements

This work is supported by the National Key Research and Development Program of China (2016YFF0101400); National Natural Science Foundation of China (6171101129, 61427818, 61827825, and 61735017).

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Authors and Affiliations

  1. Quantum Optics Lab, Department of Physics, COMSATS University, Islamabad, Pakistan

    Anwar Hussain

  2. State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, 310027, China

    Anwar Hussain, Yicheng Li, Diyi Liu, Yinxu Bian, Cuifang Kuang & Xu Liu

  3. Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, 030006, China

    Cuifang Kuang & Xu Liu

Authors
  1. Anwar Hussain
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  2. Yicheng Li
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  3. Diyi Liu
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  4. Yinxu Bian
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  5. Cuifang Kuang
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  6. Xu Liu
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Correspondence to Xu Liu.

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Hussain, A., Li, Y., Liu, D. et al. Axial scanning in lensless microscopy to achieve high resolution. Appl. Phys. B 125, 43 (2019). https://doi.org/10.1007/s00340-019-7146-7

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  • DOI: https://doi.org/10.1007/s00340-019-7146-7

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