Abstract
We report on a modified nonlinear optical measurement technique using an absorptive phase object (PO) to characterize weak optical refraction nonlinearities. The absorptive PO consists of a circular silica substrate on which a dielectric plate has been deposited. The inner dielectric plate simultaneously introduces a π/2 phase shift and changes the amplitude of the incident light. We demonstrate that the measurement sensitivity can be enhanced with the transmittance of the absorptive PO. Experimental and simulation results are presented to validate our approach.
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Acknowledgements
The authors gratefully acknowledge the support of the National Natural Science Fund of China (Grant Nos. 11304216 and 91227113), the Priority Academic Program Development (PAPD) of Jiangsu Higher Education Institutions, and the Prospective Joint Research Project of the Cooperative Innovation Fund of Jiangsu Province, China (Grant No. BY2014059-11).
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Yang, Y., Yang, JY., Li, ZG. et al. Sensitive measurement of optical nonlinearity using an absorptive phase object. Appl. Phys. B 123, 248 (2017). https://doi.org/10.1007/s00340-017-6825-5
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DOI: https://doi.org/10.1007/s00340-017-6825-5