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Study of all-angle negative refraction of light in metal–dielectric–metal multilayered structures based on generalized formulas of reflection and refraction

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Abstract

In this paper, refraction behaviors of light in both metal single-layered film and metal–dielectric–metal multilayered films are investigated based on the generalized formulas of reflection and refraction. The obtained results, especially, dependence of power refractive index on incident angles for a light beam traveling through a metal–dielectric–metal multilayered structure, are well consistent with the experimental observations. Our work may offer a new angle of view to understand the all-angle negative refraction of light in metal–dielectric–metal multilayered structures, and provide a convenient approach to optimize the devised design and address the issue on making the perfect lens.

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Authors and Affiliations

  1. College of Electronic Science and Engineering, Nanjing University of Posts & Telecommunications, Nanjing, 210046, People’s Republic of China

    Jiangwei Chen

  2. National Key Laboratory of Electromagnetic Environmental Effects & Optoelectric Engineering, Nanjing, 210007, People’s Republic of China

    Jiangwei Chen, Jun Liu & Weidong Xu

Authors
  1. Jiangwei Chen
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  2. Jun Liu
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  3. Weidong Xu
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Correspondence to Jiangwei Chen.

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Chen, J., Liu, J. & Xu, W. Study of all-angle negative refraction of light in metal–dielectric–metal multilayered structures based on generalized formulas of reflection and refraction. Appl. Phys. B 123, 229 (2017). https://doi.org/10.1007/s00340-017-6804-x

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  • DOI: https://doi.org/10.1007/s00340-017-6804-x

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