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Nonlinear ellipse rotation measurements in optical thick samples

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Abstract

Nonlinear refractive indices of several optical glasses were measured by means of the nonlinear ellipse rotation method in a tightly focused laser beam condition, leading to the improvement of the spatial resolution which allows probing the local refractive nonlinearity with better accuracy. The use of a short focal length results in a Rayleigh range shorter than the sample thickness, and this feature can be explored to measure two stacked samples in a single run. In this way, it is possible to simultaneously probe a reference and an unknown sample, improving significantly the refractive nonlinearity determination. Several optical glasses were characterized by this method using fused silica as reference.

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Acknowledgments

This research was supported by the Brazilian agencies: Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP, Grant: 2013/11514-5) and Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq, Grant: 475428/2013-7).

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Authors and Affiliations

  1. Instituto de Física de São Carlos, Universidade de São Paulo, Caixa Postal 369, São Carlos, SP, 13560-970, Brazil

    M. L. Miguez, E. C. Barbano, J. A. Coura, S. C. Zílio & L. Misoguti

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  1. M. L. Miguez
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  2. E. C. Barbano
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  3. J. A. Coura
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  4. S. C. Zílio
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  5. L. Misoguti
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Correspondence to L. Misoguti.

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Miguez, M.L., Barbano, E.C., Coura, J.A. et al. Nonlinear ellipse rotation measurements in optical thick samples. Appl. Phys. B 120, 653–658 (2015). https://doi.org/10.1007/s00340-015-6178-x

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  • DOI: https://doi.org/10.1007/s00340-015-6178-x

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