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Structural correlation of GeTeSeGa system by XRD and far-infrared spectroscopy

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Abstract

The structural properties of quaternary Ge10Te80Se10-xGax (x = 0 to 10) glassy alloy have been studied with XRD (X-ray diffraction) and FTIR (Fourier transform infrared) spectroscopy. The position of FSDP (first sharp diffraction peak) (2θ) and its FWHM (full width half maxima) have been utilized to estimate the local structure parameters of FSDP like repeating distance y and structural correlation length (L). The far-infrared (IR) transmission spectra of Ge10Te80Se10-xGax (x = 0, 2, 4, 6, 8, 10) have been analysed in the range 30–300 cm−1 to study the formation of bonds using chain crossing model, random covalent network model and chemical bond approach. The theoretical calculations have been executed for bond energies, force constants, wave number, etc., for probable bonds, and the results justify the experimental values. The present study contributes to the understanding of the composition-dependent structural property relationship of chalcogenide glasses.

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Acknowledgement

The authors are thankful to JIIT Noida for providing the XRD facility and SAIF, IIT Bombay, for FTIR facility. PS gratefully acknowledges SERB-DST, India, for “project file no. EMR/2014/001108, Dated 11/09/2015”.

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  1. Department of Physics & Materials Science, Jaypee University of Information Technology, Waknaghat, Solan, HP-173234, India

    Ekta Sharma & P. B. Barman

  2. Applied Science Department, National Institute of Technical Teachers Training and Research, Sector 26, Chandigarh, 160019, India

    Pankaj Sharma

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Sharma, E., Barman, P.B. & Sharma, P. Structural correlation of GeTeSeGa system by XRD and far-infrared spectroscopy. Appl. Phys. A 127, 345 (2021). https://doi.org/10.1007/s00339-021-04493-x

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