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Study of drag resistivity in dielectric medium with the correlations effect

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Abstract

We study the drag resistivity numerically for charge carriers in a specially separated electron-electron (e-e) bilayer system for both the symmetric and asymmetric case in weak interaction and Boltzmann regime. Interaction in Coulomb drag effect is based on Coulomb interaction in a specially separated bilayer systems. Random phase approximation (RPA) method is used to find the drag resistivity. Simply RPA method is a reliable method for high-density regime where exchange and correlation effects do not impact too much. On lowering the density, the exchange and correlation effects are significant which are included by suggesting the local field correction (LFC) in effective interlayer interactions. The drag resistivity is noticed improvement on employing the LFC. Impact of exchange and correlation based LFC increase on increasing the temperature and decreasing the concentration. Predictable behaviour is shown by the dependency of drag resistivity on temperature, density, interlayer spacing, and dielectric constant.

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Data availability statement

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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Acknowledgements

We thank Dr. K. N. Pathak for very useful, helpful and stimulating discussions. My research work in SVNIT was supported by the Indian Ministry of Education through the grant of CSIR and MHRD. We acknowledge the CSIR under the JRF and SRF fellowship, file no. 09/1007(0004)/2018-EMR-I for financial support in our research.

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  1. Department of Physics, Sardar Vallabhbhai National Institute of Technology, Surat, 395007, India

    Sharad Kumar Upadhyay & L. K. Saini

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  1. Sharad Kumar Upadhyay
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  2. L. K. Saini
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SKU helped in conceptualization, methodology, validation, investigation, writing–original draft, visualization; LKS contributed to supervision.

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Correspondence to L. K. Saini.

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Upadhyay, S.K., Saini, L.K. Study of drag resistivity in dielectric medium with the correlations effect. Appl. Phys. A 127, 276 (2021). https://doi.org/10.1007/s00339-021-04422-y

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