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Planning time-censored inspection schemes for k-out-of-n systems with gamma distributed component lifetimes

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Abstract

The determination of the best inspection scheme for lot acceptance purposes is a prominent optimization problem arising in industrial reliability and quality control. Assuming that the component lifetime distribution is gamma, constrained optimization problems are stated and solved in order to find optimal acceptance sampling plans for k-out-of-n systems based on time-censored component reliability tests. The objective function to minimize is the required number of components to test, whereas the nonlinear constraints are related to the maximum risks that the producer and the consumer are disposed to tolerate at the corresponding acceptable and rejectable quality levels. The optimal decision criterion is based on the number of observed component failures until a specific censoring time. The proposed acceptance sampling plans are particularly useful when the reliability engineer is interested in determining the acceptability of a k-out-of-n system before assembly, especially when the assembled system is expensive to test. The results developed are illustrated by various numerical examples, including the analysis of a system of water pumps for cooling a reactor.

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References

  1. Baklizi A, El Masri AEQ (2004) Acceptance sampling based on truncated life tests in the Birnbaum Saunders model. Risk Anal 24:1453–1457

    Article  Google Scholar 

  2. Hong C-W, Wu J-W, Cheng C-H (2007) Computational procedure of performance assessment of lifetime index of businesses for the Pareto lifetime model with the right type II censored sample. Appl Math Comput 184:336–350

    MathSciNet  MATH  Google Scholar 

  3. Arizono I, Kawamura Y, Takemoto Y (2008) Reliability tests for Weibull distribution with variational shape parameter based on sudden death lifetime data. Eur J Oper Res 189:570–574

    Article  MathSciNet  MATH  Google Scholar 

  4. Fernández AJ (2008) Reliability inference and sample-size determination under double censoring for some two-parameter models. Comput Stat Data Anal 52:3426–3440

    Article  MathSciNet  MATH  Google Scholar 

  5. Lu W, Tsai T-R (2009) Interval censored sampling plans for the gamma lifetime model. Eur J Oper Res 192:116–124

    Article  MathSciNet  MATH  Google Scholar 

  6. Seo JH, Jung M, Kim CM (2009) Design of accelerated life test sampling plans with a nonconstant shape parameter. Eur J Oper Res 197:659–666

    Article  MathSciNet  MATH  Google Scholar 

  7. Fernández AJ, Pérez-González CJ (2012) Generalized beta prior models on fraction defective in reliability test planning. J Comput Appl Math 236:3147–3159

    Article  MathSciNet  MATH  Google Scholar 

  8. Fernández AJ, Pérez-González CJ (2012) Optimal acceptance sampling plans for log-location-scale lifetime models using average risks. Comput Stat Data Anal 56:719–731

    Article  MathSciNet  MATH  Google Scholar 

  9. Aslam M, Balamurali S, Jun C-H, Ahmad M, Rasool M (2012) Optimal designing of an Skip-V skip lot sampling plans with double sampling plan as reference plan. Int J Adv Manuf Technol 60:733–740

    Article  Google Scholar 

  10. Aslam M, Yen C-H, Chang C-H, Jun C-H (2014) Multiple dependent state variable sampling plans with process loss consideration. Int J Adv Manuf Technol 71(5):1337–1343

    Article  Google Scholar 

  11. Yen C-H, Aslam M, Jun C-H (2014) A lot inspection sampling plan based on EWMA yield index. Int J Adv Manuf Technol 75:861–868

    Article  Google Scholar 

  12. Gupta RK, Bhunia AK, Roy DA (2009) A GA based penalty function technique for solving constrained redundancy allocation problem of series system with interval valued reliability of components. J Comput Appl Math 232:275–284

    Article  MathSciNet  MATH  Google Scholar 

  13. Bhunia AK, Sahoo L, Roy D (2010) Reliability stochastic optimization for a series system with interval component reliability via genetic algorithm. Appl Math Comput 216:929– 939

    MathSciNet  MATH  Google Scholar 

  14. Ebrahimipour V, Asadzadeh SM, Aadeh A (2013) An emotional learning-based fuzzy inference system for improvement of system reliability evaluation in redundancy allocation problem. Int J Adv Manuf Technol 66:1657–1672

    Article  Google Scholar 

  15. Hamadani AZ, Khorshidi HA (2013) System reliability optimization using time value of money. Int J Adv Manuf Technol 66:97–106

    Article  Google Scholar 

  16. Chakravarthy SR, Gómez-Corral A (2009) The influence of delivery times on repairable k-out-of-N systems with spares. Appl Math Modell 33:2368–2387

    Article  MathSciNet  MATH  Google Scholar 

  17. Gurler S, Bairamov I (2009) Parallel and k-out-of-n:G systems with nonidentical components and their mean residual life functions. Appl Math Modell 33:1116–1125

    Article  MathSciNet  MATH  Google Scholar 

  18. Fernández AJ (2010) Tolerance limits for k-out-of-n systems with exponentially distributed component lifetimes. IEEE Trans Reliab 59:331–337

    Article  Google Scholar 

  19. Fernández AJ (2014) Computing tolerance limits for the lifetime of a k-out-of-n:F system based on prior information and censored data. Appl Math Modell 38:548–561

    Article  MathSciNet  Google Scholar 

  20. Radwan T, Habib A, Alseedy R, Elsherbeny A (2011) Bounds for increasing multi-state consecutive k-out-of-d-from-n:F system with equal components probabilities. Appl Math Modell 35:2366–2373

    Article  MathSciNet  MATH  Google Scholar 

  21. Yuan L (2012) Reliability analysis for a k-out-of-n:G system with redundant dependency and repairmen having multiple vacations. Appl Math Comput 218:11959–11969

    MathSciNet  MATH  Google Scholar 

  22. Fernández AJ (2011) Optimal reliability demonstration test plans for k-out-of-n systems of gamma distributed components. IEEE Trans Reliab 60:833–844

    Article  Google Scholar 

  23. Misra M, van der Meulen EC, Branden KV (2006) On estimating the scale parameter of the selected gamma population under the scale invariant squared error loss function. J Comput Appl Math 186:268–282

    Article  MathSciNet  MATH  Google Scholar 

  24. Adell JA, Alzer H (2009) Inequalities for the median of the gamma distribution. J Comput Appl Math 232:481–495

    Article  MathSciNet  MATH  Google Scholar 

  25. Kleefeld A, Brazauskas V (2012) A statistical application of the quantile mechanics approach: MTM estimators for the parameters of t and gamma distributions. Eur J Appl Math 23:593–610

    Article  MathSciNet  MATH  Google Scholar 

  26. Ramos B, Aragón A, Melgosa C (2015) Validation of a tolerance analysis simulation procedure in assemblies. Int J Adv Manuf Technol 76:1297–1310

    Article  Google Scholar 

  27. Fernández AJ (2004) One- and two-sample prediction based on doubly censored exponential data and prior information. Test 13:403–416

    Article  MathSciNet  MATH  Google Scholar 

  28. Fernández AJ (2006) Bounding maximum likelihood estimates based on incomplete ordered data. Comput Stat Data Anal 50:2014–2027

    Article  MathSciNet  MATH  Google Scholar 

  29. Lee W-C, Wu J-W, Hong C-W (2009) Assessing the lifetime performance index of products with the exponential distribution under progressively type II right censored samples. J Comput Appl Math 231:648–656

    Article  MathSciNet  MATH  Google Scholar 

  30. Pérez-González CJ, Fernández AJ (2009) Accuracy of approximate progressively censored reliability sampling plans for exponential models. Stat Pap 50:161–170

    Article  MathSciNet  MATH  Google Scholar 

  31. Zhang HY, Shamsuzzaman M, Xie M, Goh TN (2011) Design and application of exponential chart for monitoring time-between-events data under random process shift. Int J Adv Manuf Technol 57:849–857

    Article  Google Scholar 

  32. Dey O, Chakraborty D (2012) A fuzzy random periodic review system with variable lead-time and negative exponential crashing cost. Appl Math Modell 36:6312–6322

    Article  MathSciNet  MATH  Google Scholar 

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Correspondence to Arturo J. Fernández.

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Fernández, A.J. Planning time-censored inspection schemes for k-out-of-n systems with gamma distributed component lifetimes. Int J Adv Manuf Technol 89, 3139–3147 (2017). https://doi.org/10.1007/s00170-016-9301-1

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  • DOI: https://doi.org/10.1007/s00170-016-9301-1

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