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A Comprehensive Review to Investigate the Effect of Read Port Topology on the Performance of Different 7 T SRAM Cells

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Innovations in VLSI, Signal Processing and Computational Technologies (WREC 2023)

Abstract

SRAM-based cache memory is an important component for microprocessor-based circuit. The growing demand for portable devices with prolonged battery life has driven designers to report SRAM bit cells with varying topologies. The 7T cell is one of the most popular bit cell topologies. As a consequence, five different 7T cells with a common internal memory core configuration and different read port topologies are reviewed in this paper. The technology node for each cell is 32 nm, while the supply voltage is 0.8 V. The cell topologies are analyzed for static noise margin and time requirement for each operation. It is identified that the 7T4 and 7T5 cells have best read stability at 314 and 324 mV, respectively. In terms of read time requirement, the 7T4 and 7T5 cells are identified to be the best at  5 ps each.

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References

  • Ahlawat S, Siddharth, Rawat B, Mittal P (2021) A comparative performance analysis of varied 10T SRAM cell topologies at 32 nm technology node. International conference on modeling, simulation and optimization

    Google Scholar 

  • Aly RE, Bayoumi MA (2007) Low-power cache design using 7T SRAM cell. IEEE Trans Circ Syst II Express Briefs 54(4):318–322

    Article  Google Scholar 

  • Bharti R, Mittal P (2021) Comparative analysis of different types of inverters for low power at 45 nm. In: 3rd IEEE international conference on advances in computing, communication control and networking (ICAC3N-21)

    Google Scholar 

  • Calhoun BH, Wang A, Chandrakasan A (2005) Modeling and sizing for minimum energy operation in subthreshold circuits. IEEE J Solid-State Circ 40(9):1778–1786

    Article  Google Scholar 

  • Chaturvedi M, Garg M, Rawat B, Mittal P (2021) 8T SRAM bit cell with improved read stability for 90 nm technology node. International conference on simulation, automation, & smart manufacturing (SASM)

    Google Scholar 

  • Cho K, Park J, Oh TW, Jung SO (2020) One-sided Schmitt-trigger-based 9T SRAM cell for near-threshold operation. IEEE Trans Circ Syst I Regul Pap 67(5):1551–1561

    Article  Google Scholar 

  • Divya, Mittal P (April 2022) A low-power high-performance voltage sense amplifier for static RAM and comparison with existing current/voltage sense amplifiers. Int J Inf Technol (BJIT) 14:323–331

    Google Scholar 

  • Giterman R, Vicentowski M, Levi I, Weizman Y, Keren O, Fish A (2018) Leakage power attack-resilient symmetrical 8T SRAM cell. IEEE Trans Very Large Scale Integr (VLSI) Syst 26(10):2180–2184

    Google Scholar 

  • Jiang J, Xu Y, Zhu W, Xiao J, Zou S (2019) Quadruple cross-coupled latch-based 10T and 12T SRAM bit-cell designs for highly reliable terrestrial applications. IEEE Trans Circ Syst I Regul Pap 66(3):967–977

    Article  Google Scholar 

  • Kulkarni JP, Kim K, Roy K (2007) A 160 mV robust Schmitt trigger based subthreshold SRAM. IEEE J Solid-State Circ 42(10):2303–2313

    Article  Google Scholar 

  • Kumar B, Kaushik BK, Negi YS (2014) Design and analysis of noise margin, write ability and read stability of organic and hybrid 6-T SRAM cell. Microelectron Reliab 54(12):2801–2812

    Article  Google Scholar 

  • Kushwah CB, Vishvakarma SK (2016) A single-ended with dynamic feedback control 8T subthreshold SRAM cell. IEEE Trans Very Large Scale Integr (VLSI) Syst 24(1):373–377

    Google Scholar 

  • Lin S, Kim YB, Lombardi F (2010) Design and analysis of a 32 nm PVT tolerant CMOS SRAM cell for low leakage and high stability. Integration 43(2):176–187

    Article  Google Scholar 

  • Oh JS, Park J, Cho K, Oh TW, Jung SO (2021) Differential read/write 7T SRAM with bit-interleaved structure for near-threshold operation. IEEE Access 9:64104–64115

    Article  Google Scholar 

  • Rawat B, Gupta K, Goel N (2018) Low voltage 7T SRAM bit cell in 32 nm CMOS technology node. 2018 international conference of computing, power and communications technologies (GUCON)

    Google Scholar 

  • Rawat B, Mittal P (2021a) Single bit line accessed high high performance ultra-low voltage operating 7T SRAM bit cell with improved read stability. Int J Circ Theory Appl 49(5):1435–1449

    Article  Google Scholar 

  • Rawat B, Mittal P (2021b) A 32 nm single ended single port 7T SRAM for low power utilization. Semicond Sci Technol 36(9):095006–095022

    Article  Google Scholar 

  • Rawat B, Mittal P (2022a) A reliable and temperature variation tolerant 7T SRAM cell with single bitline configuration for low voltage application. Circ Syst Sign Proces 41(1):2779–2801

    Article  Google Scholar 

  • Rawat B, Mittal P (2022b) A comprehensive analysis of different 7T SRAM topologies to design a 1R1W bit interleaving enabled and half select free cell for 32 nm technology node. Proc R Soc a: Math, Phys, Eng Sci 478(2259):20210745–20210771

    Article  Google Scholar 

  • Shin K, Choi W, Park J (2017) Half-select free and bit-line sharing 9T SRAM for reliable supply voltage scaling. IEEE Trans Circ Syst I Regul Pap 64(8):2036–2048

    Article  Google Scholar 

  • Singh J, Mohanty SP, Pradhan DK (2013) Robust SRAM designs and analysis. Springer, New York, pp 95–96

    Book  Google Scholar 

  • Wen L, Zhang Y, Zeng X (2019) Column-selection-enabled 10T SRAM utilizing shared diff-VDD write and dropped-VDD read for power reduction. IEEE Trans Very Large Scale Integr (VLSI) Syst 27(6):1470–1474

    Google Scholar 

  • Yang Y, Jeong H, Song SC, Wang J, Yeap G, Jung SO (2016) Single bit-line 7T SRAM cell for near-threshold voltage operation with enhanced performance and energy in 14 nm FinFET technology. IEEE Trans Circ Syst I Regul Pap 63(7):1023–1032

    Article  MathSciNet  Google Scholar 

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Correspondence to Poornima Mittal .

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Rawat, B., Mittal, P. (2024). A Comprehensive Review to Investigate the Effect of Read Port Topology on the Performance of Different 7 T SRAM Cells. In: Mehta, G., Wickramasinghe, N., Kakkar, D. (eds) Innovations in VLSI, Signal Processing and Computational Technologies. WREC 2023. Lecture Notes in Electrical Engineering, vol 1095. Springer, Singapore. https://doi.org/10.1007/978-981-99-7077-3_3

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  • DOI: https://doi.org/10.1007/978-981-99-7077-3_3

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  • Online ISBN: 978-981-99-7077-3

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