Skip to main content
SpringerLink
Log in

Correlative Electron Microscopy and Atom Probe Tomography—Experimental Techniques and Its Applications

  • Chapter
  • First Online:
New Horizons in Metallurgy, Materials and Manufacturing

Part of the book series: Indian Institute of Metals Series ((IIMS))

  • 443 Accesses

Abstract

In recent times, applying correlative experimental techniques using electron microscopy (EM) and atom probe tomography (APT) to interpret several materials science problems have shown promising results. Especially, getting structural and three-dimensional compositional information from the same region of interest on a material led to understanding mechanisms occurring at the atomic scale. Direct integration of these mechanisms with material properties can open avenues for new material development. Some recent correlative experimental methods and protocols will be discussed in this chapter with relevant examples.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
eBook
USD 16.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. D.B. Williams, C.B. Carter, Transmission Electron Microscopy: A Textbook for Materials Science, 2nd edn. (Springer, US, 2009)

    Book  Google Scholar 

  2. R.F. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Springer, US, 2005)

    Book  Google Scholar 

  3. F. De Geuser, B. Gault, Acta Mater. 188, 406–415 (2020)

    Article  Google Scholar 

  4. T.F. Kelly, D.J. Larson, Annu. Rev. Mater. Res. 42, 1–31 (2012)

    Article  CAS  Google Scholar 

  5. E.W. Müller, J.A. Panitz, S.B. McLane, Rev. Sci. Instrum. 39, 83–86 (1968)

    Article  Google Scholar 

  6. R.K.W. Marceau, G. Sha, R.N. Lumley, S.P. Ringer, Acta Mater. 58, 1795–1805 (2010)

    Article  CAS  Google Scholar 

  7. S. Medrano, H. Zhao, F. De Geuser, B. Gault, L.T. Stephenson, A. Deschamps, D. Ponge, D. Raabe, C.W. Sinclair, Acta Mater. 161, 12–20 (2018)

    Article  CAS  Google Scholar 

  8. D. Palanisamy, S. Ener, F. Maccari, L. Schäfer, K.P. Skokov, O. Gutfleisch, D. Raabe, B. Gault, Phys. Rev. Materials 4, 054404 (2020)

    Article  CAS  Google Scholar 

  9. S. Meher, L.J. Carroll, T.M. Pollock, M.C. Carroll, Scripta Mater. 113, 185–189 (2016)

    Article  CAS  Google Scholar 

  10. P. Pandey, A.K. Sawant, B. Nithin, Z. Peng, S.K. Makineni, B. Gault, K. Chattopadhyay, Acta Mater. 168, 37–51 (2019)

    Article  CAS  Google Scholar 

  11. O.C. Hellman, D.N. Seidman, Mater. Sci. Eng., A 327, 24–28 (2002)

    Article  Google Scholar 

  12. M. Herbig, D. Raabe, Y.J. Li, P. Choi, S. Zaefferer, S. Goto, Phys. Rev. Lett. 112, 126103 (2014)

    Article  CAS  Google Scholar 

  13. B. Gault, M.P. Moody, J.M. Cairney, S.P. Ringer, Mater. Today 15, 378–386 (2012)

    Article  CAS  Google Scholar 

  14. V.J. Araullo-Peters, B. Gault, S.L. Shrestha, L. Yao, M.P. Moody, S.P. Ringer, J.M. Cairney, Scripta Mater. 66, 907–910 (2012)

    Article  CAS  Google Scholar 

  15. T.F. Kelly, P.P. Camus, D.J. Larson, L.M. Holzman, S.S. Bajikar, Ultramicroscopy 62, 29–42 (1996)

    Article  CAS  Google Scholar 

  16. B. Gault, M.P. Moody, J.M. Cairney, S.P. Ringer, Atom Probe Microscopy (Springer-Verlag, New York, 2012)

    Book  Google Scholar 

  17. B. Gault, M.P. Moody, F.D. Geuser, A.L. Fontaine, L.T. Stephenson, D. Haley, S.P. Ringer, Microsc. Microanal. 16, 99–110 (2010)

    Article  CAS  Google Scholar 

  18. J.M. Hyde, A. Cerezo, R.P. Setna, P.J. Warren, G.D.W. Smith, Appl. Surf. Sci. 76–77, 382–391 (1994)

    Article  Google Scholar 

  19. B. Gault, S.T. Loi, V.J. Araullo-Peters, L.T. Stephenson, M.P. Moody, S.L. Shrestha, R.K.W. Marceau, L. Yao, J.M. Cairney, S.P. Ringer, Ultramicroscopy 111, 1619–1624 (2011)

    Article  CAS  Google Scholar 

  20. E.A. Marquis, F. Vurpillot, Microsc. Microanal. 14, 561–570 (2008)

    Article  CAS  Google Scholar 

  21. A.J.W. Moore, J.A. Spink, Surf. Sci. 44, 198–212 (1974)

    Article  CAS  Google Scholar 

  22. A.J. Melmed, J. Vacuum Sci. Tech. B: Microelect. Nanometer Struct. Process., Measurement, Phenomena 9, 601–608 (1991)

    Google Scholar 

  23. A. Eades, Microsc. Res. Tech. 20, 217–217 (1992)

    Article  Google Scholar 

  24. J.M. Papazian, J. Microsc. 94, 63–67 (1971)

    Article  Google Scholar 

  25. H. Nordén, K.M. Bowkett, J. Sci. Instrum. 44, 238–240 (1967)

    Article  Google Scholar 

  26. A.R. Waugh, S. Payne, G.M. Worrall, G.D.W. Smith, J. Phys. Coll. 45, C9-C9–209 (1984)

    Google Scholar 

  27. K. Thompson, D. Lawrence, D.J. Larson, J.D. Olson, T.F. Kelly, B. Gorman, Ultramicroscopy 107, 131–139 (2007)

    Article  CAS  Google Scholar 

  28. S.K. Makineni, M. Lenz, P. Kontis, Z. Li, A. Kumar, P.J. Felfer, S. Neumeier, M. Herbig, E. Spiecker, D. Raabe, B. Gault, JOM, 1–8 (2018)

    Google Scholar 

  29. M.K. Miller, K.F. Russell, G.B. Thompson, Ultramicroscopy 102, 287–298 (2005)

    Article  CAS  Google Scholar 

  30. D.J. Larson, D.T. Foord, A.K. Petford-Long, H. Liew, M.G. Blamire, A. Cerezo, G.D.W. Smith, Ultramicroscopy 79, 287–293 (1999)

    Article  CAS  Google Scholar 

  31. P.J. Felfer, T. Alam, S.P. Ringer, J.M. Cairney, Microsc. Res. Tech. 75, 484–491 (2012)

    Article  CAS  Google Scholar 

  32. S.-I. Baik, D. Isheim, D.N. Seidman, Ultramicroscopy 184, 284–292 (2018)

    Article  CAS  Google Scholar 

  33. M. Herbig, P. Choi, D. Raabe, Ultramicroscopy 153, 32–39 (2015)

    Article  CAS  Google Scholar 

  34. M. Herbig, Scripta Mater. 148, 98–105 (2018)

    Article  CAS  Google Scholar 

  35. M.H.F. Overwijk, F.C. van den Heuvel, C.W.T. Bulle-Lieuwma, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing. Measurement, and Phenomena 11, 2021–2024 (1993)

    CAS  Google Scholar 

  36. L.A. Giannuzzi, F.A. Stevie, Micron 30, 197–204 (1999)

    Article  Google Scholar 

  37. P. Pandey, S.K. Makineni, B. Gault, K. Chattopadhyay, Acta Mater. 170, 205–217 (2019)

    Article  CAS  Google Scholar 

  38. K.E. Knipling, D.C. Dunand, D.N. Seidman, MEKU 97, 246–265 (2006)

    Article  CAS  Google Scholar 

  39. S. Özbilen, H.M. Flower, Acta Metall. 37, 2993–3000 (1989)

    Article  Google Scholar 

  40. K. Babinsky, R. De Kloe, H. Clemens, S. Primig, Ultramicroscopy 144, 9–18 (2014)

    Article  CAS  Google Scholar 

  41. R.R. Keller, R.H. Geiss, J. Microsc. 245, 245–251 (2012)

    Article  CAS  Google Scholar 

  42. T. Schwarz, G. Stechmann, B. Gault, O. Cojocaru-Mirédin, R. Wuerz, D. Raabe, Prog. Photovoltaics Res. Appl. 26, 196–204 (2018)

    Article  CAS  Google Scholar 

  43. S.-P. Tsai, S.K. Makineni, B. Gault, K. Kawano-Miyata, A. Taniyama, S. Zaefferer, Acta Mater. 210, 116822 (2021)

    Article  CAS  Google Scholar 

  44. H.J. Im, S.K. Makineni, B. Gault, F. Stein, D. Raabe, P.-P. Choi, Scripta Mater. 154, 159–162 (2018)

    Article  CAS  Google Scholar 

  45. H.J. Im, S.K. Makineni, C.-S. Oh, B. Gault, P.-P. Choi, Microscopy and Microanalysis (undefined/ed), 1–5

    Google Scholar 

  46. B.P. Geiser, T.F. Kelly, D.J. Larson, J. Schneir, J.P. Roberts, Microsc. Microanal. 13, 437–447 (2007)

    Article  CAS  Google Scholar 

  47. P. Pandey, S.K. Makineni, A. Samanta, A. Sharma, S.M. Das, B. Nithin, C. Srivastava, A.K. Singh, D. Raabe, B. Gault, K. Chattopadhyay, Acta Mater. 163, 140–153 (2019)

    Article  CAS  Google Scholar 

  48. S. Zaefferer, N.-N. Elhami, Acta Mater. 75, 20–50 (2014)

    Article  CAS  Google Scholar 

  49. S. Zaefferer, J Appl Cryst 33, 10–25 (2000)

    Article  CAS  Google Scholar 

  50. http://crystalmaker.com/

  51. S.K. Makineni, A. Kumar, M. Lenz, P. Kontis, T. Meiners, C. Zenk, S. Zaefferer, G. Eggeler, S. Neumeier, E. Spiecker, D. Raabe, B. Gault, Acta Mater. 155, 362–371 (2018)

    Article  CAS  Google Scholar 

  52. M.S. Titus, A. Mottura, G. Babu Viswanathan, A. Suzuki, M.J. Mills, T.M. Pollock. Acta Mat. 89, 423–437 (2015)

    Google Scholar 

  53. Y.M. Eggeler, J. Müller, M.S. Titus, A. Suzuki, T.M. Pollock, E. Spiecker, Acta Mater. 113, 335–349 (2016)

    Article  CAS  Google Scholar 

  54. B.A. Benson, R.G. Hoagland, Scr. Metall. 23, 1943–1948 (1989)

    Article  CAS  Google Scholar 

  55. M. Herbig, A. Kumar, Microsc. Res. Tech. 84, 291–297 (2021)

    Article  CAS  Google Scholar 

  56. L. Lilensten, B. Gault, PLoS ONE 15, e0231179 (2020)

    Article  CAS  Google Scholar 

  57. R. Estivill, G. Audoit, J.-P. Barnes, A. Grenier, D. Blavette, Microsc. Microanal. 22, 576–582 (2016)

    Article  CAS  Google Scholar 

  58. B. Gault, A.J. Breen, Y. Chang, J. He, E.A. Jägle, P. Kontis, P. Kürnsteiner, A.K. da Silva, S.K. Makineni, I. Mouton, Z. Peng, D. Ponge, T. Schwarz, L.T. Stephenson, A. Szczepaniak, H. Zhao, D. Raabe, J. Mater. Res. 33, 4018–4030 (2018)

    Article  CAS  Google Scholar 

  59. C. Nowak, G. Schmitz, R. Kirchheim, Surf. Sci. 604, 641–648 (2010)

    Article  CAS  Google Scholar 

  60. E.F. Rauch, M. Véron, Mater. Charact. 98, 1–9 (2014)

    Article  CAS  Google Scholar 

  61. L. Amichi, I. Mouton, E. Di Russo, V. Boureau, F. Barbier, A. Dussaigne, A. Grenier, P.-H. Jouneau, C. Bougerol, D. Cooper, J. Appl. Phys. 127, 065702 (2020)

    Article  CAS  Google Scholar 

  62. V. Migunov, A. London, M. Farle, R.E. Dunin-Borkowski, J. Appl. Phys. 117, 134301 (2015)

    Article  Google Scholar 

Download references

Acknowledgements

The author is grateful to the workshop organizers for their invitation to contribute to this book. The author also acknowledges electron microscopy, atom probe tomography, and ion beam facilities in IISc Bangalore and MPIE. The author is thankful to Professor Baptiste Gault, Professor Dierk Raabe, Professor Kamanio Chattopadhyay, and Professor Dipankar Banerjee for their constant support and encouragement. The authors also acknowledge the financial support from SERB India, IISc for SEED Grant, and MPG-IISc Partner Group.

Author information

Authors and Affiliations

  1. Department of Materials Engineering, Indian Institute of Science Bangalore, Bangalore, India

    Surendra Kumar Makineni

Authors
  1. Surendra Kumar Makineni
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Surendra Kumar Makineni .

Editor information

Editors and Affiliations

  1. Department of Mechanical Engineering, Indian Institute of Technology Bombay, Mumbai, Maharashtra, India

    Amber Shrivastava

  2. Materials Science and Engineering, Indian Institute of Technology Gandhinag, Gandhinagar, Gujarat, India

    Amit Arora

  3. Department of Materials Engineering, Indian Institute of Science, Bangalore, Karnataka, India

    Chandan Srivastava

  4. Department of Metallurgical and Materials Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India

    Nikhil Dhawan

  5. Department of Materials Science and Engineering, Indian Institute of Technology Kanpur, Kanpur, Uttar Pradesh, India

    Sudhanshu Shekhar Singh

Rights and permissions

Reprints and permissions

Copyright information

© 2023 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Makineni, S.K. (2023). Correlative Electron Microscopy and Atom Probe Tomography—Experimental Techniques and Its Applications. In: Shrivastava, A., Arora, A., Srivastava, C., Dhawan, N., Shekhar Singh, S. (eds) New Horizons in Metallurgy, Materials and Manufacturing. Indian Institute of Metals Series. Springer, Singapore. https://doi.org/10.1007/978-981-19-5570-9_2

Download citation

Publish with us

Policies and ethics

Search

Navigation