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Optical Dimensional Metrology

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Handbook of Metrology and Applications

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Abstract

Optical technologies continue to expand to ease engineering metrology and improve precision of measurements. Invariantly, the optical techniques are used for the continuous, high-speed inspections of items of all shapes, sizes, and materials in Industry 5.0. Combining optics with sensors and competitive digital procedure benefits the rapid, portable, and large measurement.

Though it is impossible to accommodate the vast knowledgebase of the optical metrology, an attempt is made to cover the glimpse of recent recommendations, well established, and accepted optical methods and dimensional metrology measurement that are covered in this chapter. The applications of different properties of light and their respect techniques are discussed. The implementation of optical concept for the dimensional metrology instrumentation is categorically described.

Finally, some of the new works and prospective research are given. Therefrom, new frontiers may be thought off.

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Authors and Affiliations

  1. Length, Dimension and Nanometrology, CSIR-National Physical Laboratory, New Delhi, India

    Arif Sanjid Mahammad & K. P. Chaudhary

Authors
  1. Arif Sanjid Mahammad
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  2. K. P. Chaudhary
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Corresponding author

Correspondence to Arif Sanjid Mahammad .

Editor information

Editors and Affiliations

  1. Bhabha Atomic Research Centre, Mumbai, Maharashtra, India

    Dinesh K. Aswal

  2. Physico-Mechanical Metrology, CSIR - National Physical Laboratory, New Delhi, Delhi, India

    Sanjay Yadav

  3. National Metrology Institute of Japan, National Institute of Advanced Industria, Ibaraki, Japan

    Toshiyuki Takatsuji

  4. National Institute of Standards and Tech, GAITHERSBURG, MD, USA

    Prem Rachakonda

  5. Mechanical Engineering Department, National Institute of Technology, Delhi, India

    Harish Kumar

Section Editor information

  1. Length, Dimension and Nanometrogy, CSIR-National Physical Laboratory, New Delhi, India

    Arif Sanjid Mahammad PhD

  2. Maharaja Surajmal Institute Of Technology, New Delhi, India

    K. P. Chaudhary PhD

  3. C.V. Raman Global University, Bangalore, India

    B. S. Satyanarayan PhD

  4. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan

    Toshiyuki Takatsuji

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Mahammad, A.S., Chaudhary, K.P. (2023). Optical Dimensional Metrology. In: Aswal, D.K., Yadav, S., Takatsuji, T., Rachakonda, P., Kumar, H. (eds) Handbook of Metrology and Applications. Springer, Singapore. https://doi.org/10.1007/978-981-19-1550-5_69-2

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  • DOI: https://doi.org/10.1007/978-981-19-1550-5_69-2

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  • Print ISBN: 978-981-19-1550-5

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  1. Latest

    Optical Dimensional Metrology
    Published:
    18 April 2023

    DOI: https://doi.org/10.1007/978-981-19-1550-5_69-2

  2. Original

    Optical Dimensional Metrology
    Published:
    06 April 2023

    DOI: https://doi.org/10.1007/978-981-19-1550-5_69-1

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