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Advanced Transmission X-ray Microscopy for Energy Materials and Devices

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Advanced X-ray Imaging of Electrochemical Energy Materials and Devices

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Abstract

Transmission X-ray microscopy (TXM) can acquire a full-field projection image with spatial resolution of tens of nanometers using one-time exposure. Thus, it is easy to combine this imaging method with computed tomography and to get three-dimensional (3D) morphology information of samples. In this chapter, we will introduce the methods of TXM and corresponding operation principles, the application examples of energy materials and devices, and the possible development of these imaging technologies.

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Author information

Authors and Affiliations

  1. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China

    Qingxi Yuan & Kai Zhang

  2. Institute of Physics, Chinese Academy of Sciences, Beijing, China

    Xiqian Yu & Hongyi Pan

Authors
  1. Qingxi Yuan
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  2. Xiqian Yu
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  3. Hongyi Pan
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  4. Kai Zhang
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Corresponding author

Correspondence to Qingxi Yuan .

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Editors and Affiliations

  1. Chemical Engineering Institute, Harbin Institute of Technology, Harbin, China

    Jiajun Wang

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Yuan, Q., Yu, X., Pan, H., Zhang, K. (2021). Advanced Transmission X-ray Microscopy for Energy Materials and Devices. In: Wang, J. (eds) Advanced X-ray Imaging of Electrochemical Energy Materials and Devices. Springer, Singapore. https://doi.org/10.1007/978-981-16-5328-5_3

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