Abstract
The potential diffraction-limited angular resolution of an X-ray telescope with aperture diameter D = 1 m operating at 1 keV is Δθ ≈ λ∕D = 260 μ arc seconds, but to achieve such an impressive performance requires X-ray optics with unprecedented precision and quality. Fourier optics analysis is used to explore the geometry and accuracy of X-ray optics needed to meet this goal. Conventional grazing incidence X-ray telescopes could, in principle, work at the diffraction limit in the soft X-ray band 0.1–10 keV, but the technology and metrology required to produce the optics doesn’t currently exist. X-ray lenses are viable at energies greater than ∼10 keV, are relatively easy to make, and can provide imaging at a resolution of 3 μ arc seconds or better, but the separation of the lens and detector must be very large, typically ∼105 km. X-ray interferometry has the potential to provide diffraction-limited imaging at ultrahigh angular resolutions of 100 μ arc seconds or better, and currently available technology is good enough to manufacture the mirrors required. However, designing a practical interferometer which fits within a reasonable envelope and that has sufficient collecting area to deliver such a performance is a major challenge.
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References
C.S. Adams, I.G. Hughes, Optics f2f from Fourier to Fresnel (Oxford University Press, Oxford, 2019)
B.K. Agarwal, X-Ray Spectroscopy: An Introduction (Springer-Verlag, Berlin, Heidelberg, New York, 2013)
J.E. Baldwin et al., Astron. Astrophys. 306, L13–L16 (1996)
M. Born, E. Wolf, A.B. Bhatia, P.C. Clemmow, D. Gabor, A.R. Stokes, A.M. Taylor, P.A. Wayman, W.L. Wilcock, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, 7th edn. (Cambridge University Press, Cambridge, 1999)
W. Cash, A. Shipley, S. Osterman, J. Marshall, Nature 407, 160 (2000)
N. Davidson, A.A. Friesem, E. Hasman, Opt. Lett. 16, 523–525 (1991)
U. Fano, Physical review. APS 72(1), 26–29 (1947)
K.C. Gendreau, W.C. Cash, A.F. Shipley, N. White, SPIE 4851, 353–363 (2003)
F. Jansen et al., A&A 365, L1 (2001)
M. Lieber, D. Gallagher, W. Cash, A. Shipley, SPIE 4851, 557–567 (2003)
J.P. Mills, B.J. Thompson, J. Opt. Soc. Am. A 3, 694–703 (1986)
J.D. Monnier, Rep. Prog. Phys. 66, 789–857 (2003)
H.J. Pain, The Physics of Vibrations and Waves, 6th edn. (John Wiley & Sons Ltd, Chichester, New York, Brisbane, Toronto, Singapore, 2005)
A. Shipley, W.C. Cash, K. Gendreau, D. Gallagher, SPIE 4851, 568–576 (2003)
M.R. Sims, M.J.L. Turner, R. Willingale, Nucl. Instrum. Methods Phys. Res. 228, 512 (1980)
Y. Suzuki, Rev. Sci. Instrum. 75(4), 1026–1029 (2004)
M.J.L. Turner et al., A&A 365, L27–L35 (2001)
M.C. Weisskopf, H.D. Tananbaum, L.P. Van Speybroeck, S.L. O’Dell, SPIE Proceedings, vol. 4012 (2000)
R. Willingale, SPIE 5488, 581–592 (2004)
R. Willingale, G. Butcher, T.J. Stevenson, SPIE 5900, 432–437 (2005). Advanced X-ray Astrophysics Facility (AXAF): an overview. Proc. Soc. Photo-Opt. Eng. 2805, 2–7
H. Wolter, Ann. Phys. 10, 94 and 286 (1952)
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Willingale, R. (2022). Diffraction-Limited Optics and Techniques. In: Bambi, C., Santangelo, A. (eds) Handbook of X-ray and Gamma-ray Astrophysics. Springer, Singapore. https://doi.org/10.1007/978-981-16-4544-0_8-1
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DOI: https://doi.org/10.1007/978-981-16-4544-0_8-1
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