Abstract
Raman scattering is a powerful inelastic light scattering technique able to probe the vibrational properties of materials. This technique has been successfully employed in semiconductor nanowires to provide information on their fundamental properties, such as the phononic properties, the crystal composition, and the electronic band structure. When performed in a polarization-resolved manner on a single nanowire, Raman spectroscopy can even allow addressing the nanowire’s crystal structure. This is a fact of pivotal importance, as crystal phase is emerging as a novel degree of freedom in the bandgap engineering and phonon engineering of materials, and the control of the crystal phase is a possibility uniquely offered by nanowires. Indeed, recent advances in the synthetic growth of nanowires have given access to crystal phases (e.g., hexagonal phase in Si and Ge) that in the bulk can only be obtained under extreme pressure conditions, and it is possible to controllably switch between different crystal phases during the growth of nanowires. The realization and, even more, the interpretation of polarized Raman experiments on nanowires can be non-trivial, as several issues have to be considered. Therefore, in this chapter, we provide the basic theoretical background necessary to calculate Raman selection rules and interpret polarization-resolved Raman spectra of semiconductor nanowires. We also discuss the main ingredients of a Raman setup, with a focus on the scattering geometries typically used for nanowires. We highlight the main differences in the Raman spectra of nanowires with cubic and hexagonal crystal symmetries, and we treat also the case of the most challenging type of heterostructure: a nanoscale crystal-phase homostructure. Finally, we discuss resonant Raman experiments that allow the determination of the energy of some electronic transitions in nanowires. We focus mostly on a very new material system, namely Ge nanowires with controlled crystal phase, but the general procedure that we establish can be applied to several types of nanostructures.
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Notes
- 1.
In hexagonal lattices, the four index Bravais–Miller scheme is often used for indicating crystal directions, with [0001] labeling the c-axis direction.
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Acknowledgments
C.F. acknowledges financial support from The Sapienza University scholarship “Borsa di Perfezionamento all’Estero 2017-2018.” I.Z. acknowledges financial support from the Swiss National Science Foundation research grant (Project Grant No. 200021_165784) and from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (grant agreement No 756365). M.D.L. acknowledges support from the Swiss National Science Foundation Ambizione grant (Grant No. PZ00P2_179801). We thank Laetitia Vincent and Erik P.A.M. Bakkers for providing us with samples, Riccardo Rurali and Michele Amato for theoretical calculations, Diego De Matteis for the measurements in Figure 12, and Marcel A. Verheijen for the TEM in Figure 15. C.F. is thankful to professor Paolo Piccinni from Sapienza University for the fruitful discussion.
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Fasolato, C., Zardo, I., De Luca, M. (2021). Addressing Crystal Structure in Semiconductor Nanowires by Polarized Raman Spectroscopy. In: Fukata, N., Rurali, R. (eds) Fundamental Properties of Semiconductor Nanowires. Springer, Singapore. https://doi.org/10.1007/978-981-15-9050-4_7
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