Abstract
This paper presents a diagnostic method for singular parametric faults in analog circuits based on the Fourier coefficients and Distortion rate. The Simulation Before Test (SBT) approach has been used. In the proposed method, the DC component, the distortion rate and the fundamental amplitude extracted from Fourier analysis of the circuit output voltage signal have been selected to determine the circuit state conditions. The selection of these parameters provide a better characterizing mean of the circuit state conditions and contribute in the faults dictionary construction under faulty and fault free circuit conditions. The faults in concern are of singular parametric fault type that corresponds to a deviation from ±10 to ±50% with a 10% step variation of the circuit component nominal value. The faults classification is carried out using the Fuzzy Inference System (FIS) where the input data are the aforementioned Fourier parameters. The proposed method is illustrated through the Sallen-Key band pass filter test circuit. The obtained results show that the faults ambiguity problem being totally solved which confirm the efficiently of the proposed method in the diagnosis of the singular parametric faults in analog circuits.
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References
Kumar A, Singh AP (2013) Fuzzy classifier for fault diagnosis in analog electronic circuits. ISA Trans 52(6):816–824
Manikandan V, Devarajan N (2007) SBT approach towards analog electronic circuit fault diagnosis. Active Passive Electron Compon 2007
Huang K (2011) Modélisation de fautes et diagnostic pour les circuits mixtes/ RF nanometriques. These de Doctorat
Kavithamani A, Manikandan V, Devarajan N (2009) Analog circuit fault diagnosis based on bandwidth and fuzzy classifier. In: IEEE region 10 conference on TENCON 2009. IEEE
Bandler JW, Salama AE (1985) Fault diagnosis of analog circuits. Proc IEEE 73(8)
Vasan ASS, Long B, Pecht M (2013) Diagnostics and prognostics method for analog electronic circuits. IEEE Trans Ind Electron 60(11)
Bo F, Peng X, Junjie L, Ming D (2009) Analog circuit fault diagnosis based on neural network and fuzzy logic. In: 2009 Chinese control and decision conference. IEEE, pp 199–202
Bharat Ram R, Prasanna Moorthy V, Devarajan N (2009) Fuzzy based time domain analysis approach for fault diagnosis of analog electronic circuits. In: 2009 international conference on control, automation, communication and energy conservation. IEEE, pp 1–6
Aminian M, Aminian F (2007) A modular fault-diagnosis system for analog electronic circuits using neural network with wavelet transform as a preprocessor. IEEE Trans Instrum Meas 56(5):1546–1554
Tang J, Lin T, Chen Y (2010) Analog circuit fault diagnosis based on fuzzy support vector machine and kernel density estimation. In: 2010 3rd international conference on advanced computer theory and engineering (ICACTE), vol 4. IEEE, pp V4–544
Liu H, Chen G, Jiang S, Song G (2008) A survey of feature extraction approaches in analog circuit fault diagnosis. In: 2008 IEEE pacific-Asia workshop on computational intelligence and industrial application, vol 2. IEEE, pp 675–680
Sienkiewicz M (2010)”Méthodologie de localisation des défauts soft dans les circuits intégrés mixtes et analogiques par stimulation par faisceau laser: analyse de résultats des techniques dynamiques paramétriques. Thèse de doctorat
Peng Z, Chen J, Dong Y, Zhang B, Qiao S, Ye D, Ran L (2015) Radio frequency beamforming based on a complex domain frontend. IEEE Trans Microw Theory Tech 64(1):289–298
Yang C, Zhang X, He A, Qiu L (2017) Fault diagnosis of analog circuit based on complex model. In: Conference: 2017 32nd youth academic annual conference of Chinese association of automation (YAC). IEEE, pp 949–952
Kavithamani A, Manikandan V, Devarajan N (2011) Analog circuit fault detection using poles and fuzzy inference system. Int J Adv Eng Technol IJAET 2:260–269
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Laidani, I., Bourouba, N. (2021). Processing Signal Parameters Based Fuzzy Inference System Classifier for Analog Circuit Single Parametric Faults. In: Bououden, S., Chadli, M., Ziani, S., Zelinka, I. (eds) Proceedings of the 4th International Conference on Electrical Engineering and Control Applications. ICEECA 2019. Lecture Notes in Electrical Engineering, vol 682. Springer, Singapore. https://doi.org/10.1007/978-981-15-6403-1_62
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DOI: https://doi.org/10.1007/978-981-15-6403-1_62
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