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FTSM: Design and Reliability Measures

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Advances in System Optimization and Control

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 509))

Abstract

Multistage interconnection networks (MINs) provide an effective way to communicate between processors and memory modules in supercomputer systems. Although shuffle-exchange network (SEN) is viewed as a potential network to manage as MIN for its regular structure and most modest size of switching element (SE), the fault tolerance is an issue in SEN because it is a unique path network. Many networks have been introduced in the past to increase the fault tolerance in the SEN such as SEN−, SEN+, SEN+2, SHSEN. It has been observed that all these networks provide maximum of one fault tolerance at input/output stage. In this paper, a new network has been proposed as FTSM (fault-tolerant SEN-Minus), which addresses the fault tolerance issue with increased number of totally disjoint paths, thus improving the reliability of the entire network. To assure that reliability has been improved and increased, a thorough comparison of 2-terminal reliability has been done with all other SENs.

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Abbreviations

IN:

Interconnection network

MIN:

Multistage interconnection network

SEN:

Shuffle-exchange network

SEN+:

Shuffle-exchange network with one extra stage

SEN+2:

Shuffle-exchange network with two extra stages

SEN-Minus:

Shuffle-exchange network with one less stage

SHSEN:

Symmetric homogeneous shuffle-exchange network

FTSM:

Fault-tolerant SEN-Minus

SE:

Switching element

S-D:

Source–destination

MUX:

Multiplexer

DMUX:

Demultiplexer

N/W:

Network

RBD:

Reliability block diagram

TR:

Terminal reliability

PM2i:

Plus-Minus 2i

N :

Number of input/output in the network

R SE :

Reliability of switching element in the network

i :

Number of stage

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Author information

Authors and Affiliations

  1. Department of Electrical Engineering, NIT Kurukshetra, Kurukshetra, Haryana, India

    Shilpa Gupta & G. L. Pahuja

Authors
  1. Shilpa Gupta
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  2. G. L. Pahuja
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Corresponding author

Correspondence to Shilpa Gupta .

Editor information

Editors and Affiliations

  1. Madan Mohan Malaviya University of Technology, Gorakhpur, Uttar Pradesh, India

    Sri Niwas Singh

  2. Department of Electrical Engineering, Zhejiang University, Hangzhou, Zhejiang, China

    Fushuan Wen

  3. Department of Electrical and Electronics Engineering, I.T.S. Engineering College, Greater Noida, Uttar Pradesh, India

    Monika Jain

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Gupta, S., Pahuja, G.L. (2019). FTSM: Design and Reliability Measures. In: Singh, S., Wen, F., Jain, M. (eds) Advances in System Optimization and Control. Lecture Notes in Electrical Engineering, vol 509. Springer, Singapore. https://doi.org/10.1007/978-981-13-0665-5_1

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  • DOI: https://doi.org/10.1007/978-981-13-0665-5_1

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-0664-8

  • Online ISBN: 978-981-13-0665-5

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