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Scanning Electrochemical Microscopy

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Compendium of Surface and Interface Analysis
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Abstract

Scanning electrochemical microscopy (SECM) is a probe microscopy technique in which an ultramicroelectrode (UME) is used as a probe.

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Correspondence to Yasufumi Takahashi .

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Takahashi, Y. (2018). Scanning Electrochemical Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_89

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