Abstract
In this paper, we present an indigenously developed automated measurement setup comprising of three modules, using LabVIEW software in CSIR-NPL. The first module deals with differential measurements of any thin films, devices, elements, etc., under different magnetic field environment. Differential measurements provide analysis of individual slope of an I-V curve. The second is to measure the I-V (current-voltage) characteristics of any element or devices. The third module consists of a setup that can be used to measure the I-V characteristics of thin films, semiconductor devices, etc., from room to cryogenics temperature. Some of the results obtained using these softwares had been reported in this paper. Also the setup had been validated. The paper encourages the use of virtual instrumentation for accurate and fast measurements.
Similar content being viewed by others
References
Augarten, S.: The most widely used computer on a chip: The TMS 1000. State of the art: a photographic history of the integrated circuit. ISBN 0-89919-195-9. Retrieved, 2009-12-23 (1983)
Sharma, R., Saxena, A.K., Ojha, V.N., Kothari, P.C.: SI Units (Monograph), p. 17. NPL, New Delhi (2000)
Bernstein, P., Picard, C., Hamet, J.F., Prouteau, C., Contour, J.P., Drouet, M.: Effect of a uniform magnetic field on the I-V curves of SFFTs. IEEE Trans. Appl. Supercond. 7(2) (1997)
Dimos, D., Chaudhari, P., Watson, T.J., Mannhart, J., Ru’schlikon.: Superconducting transport properties of grain boundaries in YBa2Cu307 bicrystals. Phys. Rev. 41(7) (1990)
LabVIEW Manual 2013
Keithley source meter 6220 manual
Acknowledgements
The authors wish to thank Dr. D.K. Aswal, Director CSIR-NPL; Dr. Ranjana Mehrotra, Head, Quantum Phenomena and Applications Division, Col. Dr. O. P. Malik, Head, ECE Department of Al-Falah University for their constant encouragement and support.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Bhargav, A., Ashraf, J., Ojha, V.N. (2018). Development of Measurement and Data Acquisition Setup Using LabVIEW for Sample Characterization up to Cryogenics Temperature. In: Konkani, A., Bera, R., Paul, S. (eds) Advances in Systems, Control and Automation. Lecture Notes in Electrical Engineering, vol 442. Springer, Singapore. https://doi.org/10.1007/978-981-10-4762-6_21
Download citation
DOI: https://doi.org/10.1007/978-981-10-4762-6_21
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-4761-9
Online ISBN: 978-981-10-4762-6
eBook Packages: EngineeringEngineering (R0)