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Evolutionary Test Case Generation from UML-Diagram with Concurrency

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Advances in Computer Science and Ubiquitous Computing (UCAWSN 2016, CUTE 2016, CSA 2016)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 421))

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Abstract

To find equality between software products and artifacts, model-based test (MBT) handles specific representations of software requirement. When those conclude concurrency and loop in MBT, it explosively increases a number of paths are applied by existing coverage criteria. Therefore, in this paper, we propose exploration method to avoid path explosion problem, and solution to generate test data automatically using evolutionary algorithm. The result of practical study shows our proposal’s efficiency. Testers, who deal with their project through our approach, could find necessary test path. And our approach makes it possible to generate test data according to various test coverage criteria.

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Acknowledgments

This research was supported by Next-Generation Information Computing Development Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning (NRF-2014M3C4A7030504), and by Seoul Creative Human Development Program funded by Seoul Metropolitan Government (No.CAC1510).

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Authors and Affiliations

  1. Department of Computer Science, University of Seoul, Seoul, South Korea

    Seungchan Back, Hyorin Choi & Byungjeong Lee

  2. Department of Electrical and Computer Engineering, Ajou University, Suwon, South Korea

    Jung-Won Lee

Authors
  1. Seungchan Back
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  2. Hyorin Choi
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  3. Jung-Won Lee
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  4. Byungjeong Lee
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Corresponding author

Correspondence to Byungjeong Lee .

Editor information

Editors and Affiliations

  1. Computer Science and Engineering, Seoul National University of Science and Technology, Seoul, Korea (Republic of)

    James J. (Jong Hyuk) Park

  2. Department of Computer Science, Georgia State University, Atlanta, Georgia, USA

    Yi Pan

  3. Computer Science and Engineering, Gangneung-Wonju National University, Wonju, Korea (Republic of)

    Gangman Yi

  4. University Salerno, Fisciano, Italy

    Vincenzo Loia

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© 2017 Springer Nature Singapore Pte Ltd.

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Back, S., Choi, H., Lee, JW., Lee, B. (2017). Evolutionary Test Case Generation from UML-Diagram with Concurrency. In: Park, J., Pan, Y., Yi, G., Loia, V. (eds) Advances in Computer Science and Ubiquitous Computing. UCAWSN CUTE CSA 2016 2016 2016. Lecture Notes in Electrical Engineering, vol 421. Springer, Singapore. https://doi.org/10.1007/978-981-10-3023-9_103

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  • DOI: https://doi.org/10.1007/978-981-10-3023-9_103

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-3022-2

  • Online ISBN: 978-981-10-3023-9

  • eBook Packages: EngineeringEngineering (R0)

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